Inventor

ONOYAMA AYUMU

JP3 patents

⚠️ This page may combine multiple inventors who share the name “ONOYAMA AYUMU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

2 patents

US6829047B2Dec 7, 2004

Defect detection system

MITSUBISHI ELECTRIC CORP15 citations82

US7065238B2Jun 20, 2006

Defect inspection method and defect inspection equipment

MITSUBISHI ELECTRIC CORP3 citations58

NAKATA KAZUNARI

1 patent

US8435417B2May 7, 2013

Method of manufacturing semiconductor device

NAKATA KAZUNARI1 citations48