Inventor
ROY PRADIP KUMAR
US66 patents
⚠️ This page may combine multiple inventors who share the name “ROY PRADIP KUMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AGERE SYST GUARDIAN CORP
23 patentsUS6320244B1Nov 20, 2001
Integrated circuit device having dual damascene capacitor
AGERE SYST GUARDIAN CORP152 citations99
US6320238B1Nov 20, 2001
Gate structure for integrated circuit fabrication
AGERE SYST GUARDIAN CORP89 citations98
US6461225B1Oct 8, 2002
Local area alloying for preventing dishing of copper during chemical-mechanical polishing (CMP)
AGERE SYST GUARDIAN CORP39 citations93
US6440849B1Aug 27, 2002
Microstructure control of copper interconnects
AGERE SYST GUARDIAN CORP23 citations93
US6410986B1Jun 25, 2002
Multi-layered titanium nitride barrier structure
AGERE SYST GUARDIAN CORP40 citations93
US6410419B1Jun 25, 2002
Silicon carbide barrier layers for porous low dielectric constant materials
AGERE SYST GUARDIAN CORP29 citations93
US6368200B1Apr 9, 2002
Polishing pads from closed-cell elastomer foam
AGERE SYST GUARDIAN CORP43 citations93
US6364744B1Apr 2, 2002
CMP system and slurry for polishing semiconductor wafers and related method
AGERE SYST GUARDIAN CORP50 citations93
US6235594B1May 22, 2001
Methods of fabricating an integrated circuit device with composite oxide dielectric
AGERE SYST GUARDIAN CORP33 citations93
US6387772B1May 14, 2002
Method for forming trench capacitors in SOI substrates
AGERE SYST GUARDIAN CORP25 citations92
US6218255B1Apr 17, 2001
Method of making a capacitor
AGERE SYST GUARDIAN CORP18 citations92
US6599837B1Jul 29, 2003
Chemical mechanical polishing composition and method of polishing metal layers using same
AGERE SYST GUARDIAN CORP16 citations84
US6541394B1Apr 1, 2003
Method of making a graded grown, high quality oxide layer for a semiconductor device
AGERE SYST GUARDIAN CORP15 citations84
US6458289B1Oct 1, 2002
CMP slurry for polishing semiconductor wafers and related methods
AGERE SYST GUARDIAN CORP17 citations84
US6319837B1Nov 20, 2001
Technique for reducing dishing in Cu-based interconnects
AGERE SYST GUARDIAN CORP15 citations84
US6436830B1Aug 20, 2002
CMP system for polishing semiconductor wafers and related method
AGERE SYST GUARDIAN CORP8 citations74
US6319095B1Nov 20, 2001
Colloidal suspension of abrasive particles containing magnesium as CMP slurry
AGERE SYST GUARDIAN CORP14 citations74
US6312565B1Nov 6, 2001
Thin film deposition of mixed metal oxides
AGERE SYST GUARDIAN CORP10 citations74
US6492712B1Dec 10, 2002
High quality oxide for use in integrated circuits
AGERE SYST GUARDIAN CORP8 citations73
US6358790B1Mar 19, 2002
Method of making a capacitor
AGERE SYST GUARDIAN CORP8 citations73
US6258231B1Jul 10, 2001
Chemical mechanical polishing endpoint apparatus using component activity in effluent slurry
AGERE SYST GUARDIAN CORP12 citations73
US6249016B1Jun 19, 2001
Integrated circuit capacitor including tapered plug
AGERE SYST GUARDIAN CORP11 citations73
US6291848B1Sep 18, 2001
Integrated circuit capacitor including anchored plugs
AGERE SYST GUARDIAN CORP10 citations72
LUCENT TECHNOLOGIES INC
16 patentsUS6180518B1Jan 30, 2001
Method for forming vias in a low dielectric constant material
LUCENT TECHNOLOGIES INC100 citations98
US6265260B1Jul 24, 2001
Method for making an integrated circuit capacitor including tantalum pentoxide
LUCENT TECHNOLOGIES INC78 citations96
US6207586B1Mar 27, 2001
Oxide/nitride stacked gate dielectric and associated methods
LUCENT TECHNOLOGIES INC55 citations96
US6100587AAug 8, 2000
Silicon carbide barrier layers for porous low dielectric constant materials
LUCENT TECHNOLOGIES INC72 citations96
US6535014B2Mar 18, 2003
Electrical parameter tester having decoupling means
LUCENT TECHNOLOGIES INC59 citations95
US6008091ADec 28, 1999
Floating gate avalanche injection MOS transistors with high K dielectric control gates
LUCENT TECHNOLOGIES INC58 citations95
US6147388ANov 14, 2000
Polycide gate structure with intermediate barrier
LUCENT TECHNOLOGIES INC20 citations93
US5981403ANov 9, 1999
Layered silicon nitride deposition process
LUCENT TECHNOLOGIES INC25 citations93
US6331484B1Dec 18, 2001
Titanium-tantalum barrier layer film and method for forming the same
LUCENT TECHNOLOGIES INC20 citations92
US6204186B1Mar 20, 2001
Method of making integrated circuit capacitor including tapered plug
LUCENT TECHNOLOGIES INC20 citations92
US5960302ASep 28, 1999
Method of making a dielectric for an integrated circuit
LUCENT TECHNOLOGIES INC48 citations91
US5908312AJun 1, 1999
Semiconductor device fabrication
LUCENT TECHNOLOGIES INC39 citations90
US5641994AJun 24, 1997
Multilayered A1-alloy structure for metal conductors
LUCENT TECHNOLOGIES INC19 citations89
US6214732B1Apr 10, 2001
Chemical mechanical polishing endpoint detection by monitoring component activity in effluent slurry
LUCENT TECHNOLOGIES INC15 citations84
US6281110B1Aug 28, 2001
Method for making an integrated circuit including deutrium annealing of metal interconnect layers
LUCENT TECHNOLOGIES INC8 citations74
US6074933AJun 13, 2000
Integrated circuit fabrication
LUCENT TECHNOLOGIES INC7 citations74
AGERE SYSTEMS INC
9 patentsUS6659846B2Dec 9, 2003
Pad for chemical mechanical polishing
AGERE SYSTEMS INC28 citations93
US6548854B1Apr 15, 2003
Compound, high-K, gate and capacitor insulator layer
AGERE SYSTEMS INC37 citations93
US6551946B1Apr 22, 2003
Two-step oxidation process for oxidizing a silicon substrate wherein the first step is carried out at a temperature below the viscoelastic temperature of silicon dioxide and the second step is carried out at a temperature above the viscoelastic temperature
AGERE SYSTEMS INC26 citations92
US6524957B2Feb 25, 2003
Method of forming in-situ electroplated oxide passivating film for corrosion inhibition
AGERE SYSTEMS INC16 citations84
US7605064B2Oct 20, 2009
Selective laser annealing of semiconductor material
AGERE SYSTEMS INC15 citations83
US6720604B1Apr 13, 2004
Capacitor for an integrated circuit
AGERE SYSTEMS INC16 citations83
US6670242B1Dec 30, 2003
Method for making an integrated circuit device including a graded, grown, high quality gate oxide layer and a nitride layer
AGERE SYSTEMS INC16 citations81
US6552381B2Apr 22, 2003
Trench capacitors in SOI substrates
AGERE SYSTEMS INC12 citations74
US6540974B2Apr 1, 2003
Process for making mixed metal oxides
AGERE SYSTEMS INC8 citations74
(unassigned)
1 patentAGERE SYSTEM GUARDIAN CORP
1 patentShowing the top 50 of 66 patents by PatentIndex Score.