Inventor

SHANKARAPPA SUNEEL TUMKUR

IN2 patents

Patents

2 patents

US7272254B2Sep 18, 2007

System and method for analyzing and identifying flaws in a manufactured part

GEN ELECTRIC27 citations87

US7337651B2Mar 4, 2008

Method for performing model based scanplan generation of a component under inspection

GEN ELECTRIC6 citations56