Inventor · disambiguated record

Toshiya Nishiumi

Also filed as: NISHIUMI TOSHIYA

1 granted patent·8 citations·filing 2007–2007

31Inventor score

Technology areasG01B

Files withFUJITSU LTD1

Top patents by PatentIndex Score

1 record

0167US7465923B2Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the testFUJITSU LTD·Filed 2007·Granted Dec 16, 2008·8 cites·6 claims

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