Inventor
KAMIENIECKI EMIL
US26 patents
⚠️ This page may combine multiple inventors who share the name “KAMIENIECKI EMIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QC SOLUTIONS INC
9 patentsUS5661408AAug 26, 1997
Real-time in-line testing of semiconductor wafers
QC SOLUTIONS INC128 citations98
US6803588B2Oct 12, 2004
Apparatus and method for rapid photo-thermal surfaces treatment
QC SOLUTIONS INC19 citations92
US6325078B2Dec 4, 2001
Apparatus and method for rapid photo-thermal surface treatment
QC SOLUTIONS INC39 citations92
US6315574B1Nov 13, 2001
Method for real-time in-line testing of semiconductor wafers
QC SOLUTIONS INC24 citations92
US6069017AMay 30, 2000
Method for real-time in-line testing of semiconductor wafers
QC SOLUTIONS INC25 citations92
US6388455B1May 14, 2002
Method and apparatus for simulating a surface photo-voltage in a substrate
QC SOLUTIONS INC47 citations86
US6967490B1Nov 22, 2005
Real-time in-line testing of semiconductor wafers
QC SOLUTIONS INC3 citations73
US6909302B2Jun 21, 2005
Real-time in-line testing of semiconductor wafers
QC SOLUTIONS INC6 citations73
US6924657B2Aug 2, 2005
Real-time in-line testing of semiconductor wafers
QC SOLUTIONS INC2 citations62
KAMIENIECKI EMIL
8 patentsUS4663526AMay 5, 1987
Nondestructive readout of a latent electrostatic image formed on an insulating material
KAMIENIECKI EMIL34 citations92
US8232817B2Jul 31, 2012
Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor
KAMIENIECKI EMIL6 citations83
US7898280B2Mar 1, 2011
Electrical characterization of semiconductor materials
KAMIENIECKI EMIL13 citations83
US10429522B1Oct 1, 2019
Electrostatic hole trapping radiation detectors
KAMIENIECKI EMIL2 citations72
US10018738B2Jul 10, 2018
Inductive radiation detector
KAMIENIECKI EMIL2 citations72
US8896338B2Nov 25, 2014
Electrical characterization of semiconductor materials
KAMIENIECKI EMIL5 citations72
US10338237B2Jul 2, 2019
Inductive radiation detector
KAMIENIECKI EMIL0 citations51
US9110127B2Aug 18, 2015
Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor
KAMIENIECKI EMIL0 citations51
SEMITEST INC
4 patentsUS4827212AMay 2, 1989
Noninvasive method and apparatus for characterization of semiconductors
SEMITEST INC63 citations96
US5091691AFeb 25, 1992
Apparatus for making surface photovoltage measurements of a semiconductor
SEMITEST INC132 citations95
US4891584AJan 2, 1990
Apparatus for making surface photovoltage measurements of a semiconductor
SEMITEST INC218 citations94
US5087876AFeb 11, 1992
Apparatus and method for making surface photovoltage measurements of a semiconductor
SEMITEST INC42 citations89
OPTICAL DIAGNOSTIC SYSTEMS INC
3 patentsUS4847496AJul 11, 1989
Nondestructive readout of a latent electrostatic image formed on an insulated material
OPTICAL DIAGNOSTIC SYSTEMS INC5 citations72
US4873436AOct 10, 1989
Nondestructive readout of a latent electrostatic image formed on an insulating material
OPTICAL DIAGNOSTIC SYSTEMS INC12 citations69
US4833324AMay 23, 1989
Nondestructive readout of a latent electrostatic image formed on an insulating material
OPTICAL DIAGNOSTIC SYSTEMS INC3 citations60