Inventor
TSENG JIUNN-CHIN
TW2 patents
Patents
2 patentsUS5949726ASep 7, 1999
Bias scheme to reduce burn-in test time for semiconductor memory while preventing junction breakdown
VANGUARD INT SEMICONDUCT CORP9 citations69
US6166582ADec 26, 2000
Method and apparatus of an output buffer for controlling the ground bounce of a semiconductor device
VANGUARD INT SEMICONDUCT CORP7 citations68