Inventor
KEMELDINOV AIDYN
US3 patents
Patents
3 patentsUS12242789B2Mar 4, 2025
Overlaying on locally dispositioned patterns by ML based dynamic digital corrections (ML-DDC)
APPLIED MATERIALS INC0 citations59
US11934762B2Mar 19, 2024
Overlaying on locally dispositioned patterns by ML based dynamic digital corrections (ML-DDC)
APPLIED MATERIALS INC0 citations59
US12372881B2Jul 29, 2025
Deep learning based adaptive alignment precision metrology for digital overlay
APPLIED MATERIALS INC0 citations44