Inventor
ISHIZUKA KO
US29 patents
⚠️ This page may combine multiple inventors who share the name “ISHIZUKA KO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CANON KK
21 patentsUS5666196ASep 9, 1997
Optical detection apparatus for detecting information relating to relative displacement of an object on whch a diffraction grating is formed
CANON KK174 citations99
US7061624B2Jun 13, 2006
Grating interference type optical encoder
CANON KK24 citations92
US6674066B1Jan 6, 2004
Encoder
CANON KK20 citations92
US6618218B1Sep 9, 2003
Displacement detecting apparatus and information recording apparatus
CANON KK28 citations92
US6493170B1Dec 10, 2002
Interference device and position detection device using the same
CANON KK20 citations92
US5481106AJan 2, 1996
Encoder with an optical scale and interference of zero and first order diffraction beams
CANON KK32 citations92
US5448358ASep 5, 1995
Optical apparatus and displacement-information measuring apparatus using the same
CANON KK34 citations92
US6958469B2Oct 25, 2005
Diffraction grating interference system encoder for detecting displacement information
CANON KK13 citations84
US6473184B1Oct 29, 2002
Interferometer which divides light beams into a plurality of beams with different optical paths
CANON KK15 citations84
US7391521B2Jun 24, 2008
Position detection apparatus and method
CANON KK8 citations74
US5198873AMar 30, 1993
Encoder utilizing interference using multi-mode semiconductor laser
CANON KK16 citations74
US6657181B1Dec 2, 2003
Optical element used in compact interference measuring apparatus detecting plurality of phase difference signals
CANON KK11 citations73
US6570660B2May 27, 2003
Measuring instrument
CANON KK9 citations73
US7554671B2Jun 30, 2009
Absolute position measurement apparatus
CANON KK4 citations63
US7551290B2Jun 23, 2009
Absolute position measurement apparatus
CANON KK3 citations63
US7259863B2Aug 21, 2007
Grating interference type optical encoder
CANON KK2 citations63
US7375820B2May 20, 2008
Interference measuring apparatus for detecting a plurality of stable phase difference signals
CANON KK2 citations62
US7034947B2Apr 25, 2006
Compact interference measuring apparatus for detecting the magnitude and direction of positional deviation
CANON KK2 citations62
US9810555B2Nov 7, 2017
Absolute encoder that provides increased accuracy against defect in scale thereof
CANON KK0 citations52
US7054095B2May 30, 2006
Displacement detection apparatus, and magnetic recording apparatus and encoder using the displacement detection apparatus
CANON KK1 citations52
US9267820B2Feb 23, 2016
Two-dimensional absolute encoder and scale with marks each having one of a plurality of different characteristic values
CANON KK0 citations37
ISHIZUKA KO
8 patentsUS8759747B2Jun 24, 2014
Absolute rotary encoder
ISHIZUKA KO8 citations83
US8860949B2Oct 14, 2014
Interferometer
ISHIZUKA KO5 citations72
US8742322B2Jun 3, 2014
Encoder and interferometer that generate M-phase signals by multiplying N-phase signals by M coefficient sets, where N is not less than 6 and M is not smaller than 2
ISHIZUKA KO4 citations72
US8243279B2Aug 14, 2012
Displacement measurement apparatus
ISHIZUKA KO3 citations62
US8228508B2Jul 24, 2012
Origin detection apparatus, displacement measurement apparatus and optical apparatus
ISHIZUKA KO4 citations62
US8785838B2Jul 22, 2014
Absolute rotary encoder
ISHIZUKA KO1 citations51
US9040900B2May 26, 2015
Two-dimensional absolute encoder and scale therefor
ISHIZUKA KO0 citations41
US8416387B2Apr 9, 2013
Wavelength shift measuring apparatus, optical source apparatus, interference measuring apparatus, exposure apparatus, and device manufacturing method
ISHIZUKA KO0 citations41