Inventor

CHIH SHU-HSUAN

TW2 patents

Patents

2 patents

US8890551B2Nov 18, 2014

Test key structure and method for measuring step height by such test key structure

KANG CHIH-KAI2 citations58

US9147678B2Sep 29, 2015

Resistor and fabrication method thereof

KANG CHIH-KAI0 citations48