Inventor
HOU ALFRED S
US2 patents
Patents
2 patentsUS5381101AJan 10, 1995
System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies
UNIV LELAND STANFORD JUNIOR81 citations94
US5488305AJan 30, 1996
System and method for high-speed potentiometry using scanning probe microscope
UNIV LELAND STANFORD JUNIOR24 citations90