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Inventor
HSIN CHIH-HSING
TW
2 patents
Patents
2 patents
US6636312B1
Oct 21, 2003
Multi-pitch vernier for checking alignment accuracy
UNITED MICROELECTRONICS CORP
13 citations
79
US5773082A
Jun 30, 1998
Method for applying photoresist on wafer
UNITED MICROELECTRONICS CORP
10 citations
70