P

Inventor

TANABE TETSUYA

JP60 patents
⚠️ This page may combine multiple inventors who share the name “TANABE TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OKI ELECTRIC IND CO LTD

21 patents
US5659258AAug 19, 1997

Level shifter circuit

OKI ELECTRIC IND CO LTD62 citations96
US5596521AJan 21, 1997

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD51 citations96
US5577223ANov 19, 1996

Dynamic random access memory (DRAM) with cache and tag

OKI ELECTRIC IND CO LTD48 citations93
US6195771B1Feb 27, 2001

Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and read circuit for semiconductor memory circuit

OKI ELECTRIC IND CO LTD41 citations92
US6868021B2Mar 15, 2005

Rapidly testable semiconductor memory device

OKI ELECTRIC IND CO LTD23 citations90
US6441665B1Aug 27, 2002

Semiconductor integrated circuit

OKI ELECTRIC IND CO LTD16 citations82
US6320778B1Nov 20, 2001

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD12 citations82
US5781466AJul 14, 1998

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD13 citations82
US6522563B2Feb 18, 2003

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD7 citations74
US6362989B2Mar 26, 2002

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD5 citations74
US6249450B1Jun 19, 2001

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD6 citations74
US6052330AApr 18, 2000

Semiconductor memory with arbitrary data masking

OKI ELECTRIC IND CO LTD7 citations74
US6011709AJan 4, 2000

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD6 citations74
US5648734AJul 15, 1997

Buffer circuit and bias circuit

OKI ELECTRIC IND CO LTD11 citations74
US5511030AApr 23, 1996

Semiconductor memory device and method of driving same

OKI ELECTRIC IND CO LTD9 citations74
US5477496ADec 19, 1995

Semiconductor memory device having circuits for precharging and equalizing

OKI ELECTRIC IND CO LTD9 citations74
US6975548B2Dec 13, 2005

Memory device having redundant memory cell

OKI ELECTRIC IND CO LTD2 citations63
US6510070B2Jan 21, 2003

Semiconductor memory with built-in cache

OKI ELECTRIC IND CO LTD2 citations63
US5739719AApr 14, 1998

Bias circuit with low sensitivity to threshold variations

OKI ELECTRIC IND CO LTD5 citations63
US5652727AJul 29, 1997

Semiconductor memory device

OKI ELECTRIC IND CO LTD4 citations63
US5566115AOct 15, 1996

Semiconductor memory device

OKI ELECTRIC IND CO LTD1 citations63

OLYMPUS CORP

17 patents
US9068944B2Jun 30, 2015

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP18 citations84
US9423349B2Aug 23, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP3 citations72
US9329117B2May 3, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP6 citations72
US9395357B2Jul 19, 2016

Method of detecting sparse particles in a solution using a light-emitting probe

OLYMPUS CORP4 citations71
US9494779B2Nov 15, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single particle detection

OLYMPUS CORP2 citations63
US8680485B2Mar 25, 2014

Optical analysis method using the detection of a single light-emitting particle

OLYMPUS CORP3 citations63
US8803106B2Aug 12, 2014

Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particle

OLYMPUS CORP3 citations62
US8681332B2Mar 25, 2014

Method of measuring a diffusion characteristic value of a particle

OLYMPUS CORP3 citations62
US9528923B2Dec 27, 2016

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP2 citations61
US8785886B2Jul 22, 2014

Optical analysis method using the light intensity of a single light-emitting particle

OLYMPUS CORP3 citations61
US8024155B2Sep 20, 2011

Sample data reliability evaluation method and sample data reliability evaluation apparatus

OLYMPUS CORP2 citations54
US11119022B2Sep 14, 2021

Optical analysis device, optical analysis method, and recording medium

OLYMPUS CORP0 citations51
US9488578B2Nov 8, 2016

Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis

OLYMPUS CORP1 citations51
US11016026B2May 25, 2021

Optical analysis method and optical analysis device using single light-emitting particle detection

OLYMPUS CORP0 citations50
US8958066B2Feb 17, 2015

Optical analysis method using measurement of light of two or more wavelength bands

OLYMPUS CORP0 citations50
US9863806B2Jan 9, 2018

Optical analysis method and optical analysis device using the detection of light from a single light-emitting particle

OLYMPUS CORP0 citations42
US9739698B2Aug 22, 2017

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

OLYMPUS CORP0 citations42

IBIDEN CO LTD

4 patents

YAMAGUCHI MITSUSHIRO

3 patents

KAWASAKI YOGO

2 patents

HONDA MOTOR CO LTD

1 patent

NEC PLATFORMS LTD

1 patent

LAPIS SEMICONDUCTOR CO LTD

1 patent

Showing the top 50 of 60 patents by PatentIndex Score.