Inventor
TANABE TETSUYA
JP60 patents
⚠️ This page may combine multiple inventors who share the name “TANABE TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OKI ELECTRIC IND CO LTD
21 patentsUS5659258AAug 19, 1997
Level shifter circuit
OKI ELECTRIC IND CO LTD62 citations96
US5596521AJan 21, 1997
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD51 citations96
US5577223ANov 19, 1996
Dynamic random access memory (DRAM) with cache and tag
OKI ELECTRIC IND CO LTD48 citations93
US6195771B1Feb 27, 2001
Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and read circuit for semiconductor memory circuit
OKI ELECTRIC IND CO LTD41 citations92
US6868021B2Mar 15, 2005
Rapidly testable semiconductor memory device
OKI ELECTRIC IND CO LTD23 citations90
US6441665B1Aug 27, 2002
Semiconductor integrated circuit
OKI ELECTRIC IND CO LTD16 citations82
US6320778B1Nov 20, 2001
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD12 citations82
US5781466AJul 14, 1998
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD13 citations82
US6522563B2Feb 18, 2003
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD7 citations74
US6362989B2Mar 26, 2002
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD5 citations74
US6249450B1Jun 19, 2001
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD6 citations74
US6052330AApr 18, 2000
Semiconductor memory with arbitrary data masking
OKI ELECTRIC IND CO LTD7 citations74
US6011709AJan 4, 2000
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD6 citations74
US5648734AJul 15, 1997
Buffer circuit and bias circuit
OKI ELECTRIC IND CO LTD11 citations74
US5511030AApr 23, 1996
Semiconductor memory device and method of driving same
OKI ELECTRIC IND CO LTD9 citations74
US5477496ADec 19, 1995
Semiconductor memory device having circuits for precharging and equalizing
OKI ELECTRIC IND CO LTD9 citations74
US6975548B2Dec 13, 2005
Memory device having redundant memory cell
OKI ELECTRIC IND CO LTD2 citations63
US6510070B2Jan 21, 2003
Semiconductor memory with built-in cache
OKI ELECTRIC IND CO LTD2 citations63
US5739719AApr 14, 1998
Bias circuit with low sensitivity to threshold variations
OKI ELECTRIC IND CO LTD5 citations63
US5652727AJul 29, 1997
Semiconductor memory device
OKI ELECTRIC IND CO LTD4 citations63
US5566115AOct 15, 1996
Semiconductor memory device
OKI ELECTRIC IND CO LTD1 citations63
OLYMPUS CORP
17 patentsUS9068944B2Jun 30, 2015
Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
OLYMPUS CORP18 citations84
US9423349B2Aug 23, 2016
Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
OLYMPUS CORP3 citations72
US9329117B2May 3, 2016
Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
OLYMPUS CORP6 citations72
US9395357B2Jul 19, 2016
Method of detecting sparse particles in a solution using a light-emitting probe
OLYMPUS CORP4 citations71
US9494779B2Nov 15, 2016
Optical analysis device, optical analysis method and computer program for optical analysis using single particle detection
OLYMPUS CORP2 citations63
US8680485B2Mar 25, 2014
Optical analysis method using the detection of a single light-emitting particle
OLYMPUS CORP3 citations63
US8803106B2Aug 12, 2014
Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particle
OLYMPUS CORP3 citations62
US8681332B2Mar 25, 2014
Method of measuring a diffusion characteristic value of a particle
OLYMPUS CORP3 citations62
US9528923B2Dec 27, 2016
Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
OLYMPUS CORP2 citations61
US8785886B2Jul 22, 2014
Optical analysis method using the light intensity of a single light-emitting particle
OLYMPUS CORP3 citations61
US8024155B2Sep 20, 2011
Sample data reliability evaluation method and sample data reliability evaluation apparatus
OLYMPUS CORP2 citations54
US11119022B2Sep 14, 2021
Optical analysis device, optical analysis method, and recording medium
OLYMPUS CORP0 citations51
US9488578B2Nov 8, 2016
Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis
OLYMPUS CORP1 citations51
US11016026B2May 25, 2021
Optical analysis method and optical analysis device using single light-emitting particle detection
OLYMPUS CORP0 citations50
US8958066B2Feb 17, 2015
Optical analysis method using measurement of light of two or more wavelength bands
OLYMPUS CORP0 citations50
US9863806B2Jan 9, 2018
Optical analysis method and optical analysis device using the detection of light from a single light-emitting particle
OLYMPUS CORP0 citations42
US9739698B2Aug 22, 2017
Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
OLYMPUS CORP0 citations42
IBIDEN CO LTD
4 patentsUS7178234B2Feb 20, 2007
Method of manufacturing multi-layer printed circuit board
IBIDEN CO LTD44 citations94
US6930258B1Aug 16, 2005
Multilayer printed wiring board and method of producing multilayer printed wiring board
IBIDEN CO LTD57 citations94
US7999194B2Aug 16, 2011
Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board
IBIDEN CO LTD7 citations82
US7795542B2Sep 14, 2010
Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board
IBIDEN CO LTD5 citations72
YAMAGUCHI MITSUSHIRO
3 patentsUS8710413B2Apr 29, 2014
Optical analysis device, optical analysis method and computer program for optical analysis
YAMAGUCHI MITSUSHIRO6 citations82
US8541759B2Sep 24, 2013
Optical analysis device, optical analysis method and computer program for optical analysis
YAMAGUCHI MITSUSHIRO8 citations82
US8471220B2Jun 25, 2013
Optical analysis device, optical analysis method and computer program for optical analysis
YAMAGUCHI MITSUSHIRO13 citations82
KAWASAKI YOGO
2 patentsHONDA MOTOR CO LTD
1 patentNEC PLATFORMS LTD
1 patentLAPIS SEMICONDUCTOR CO LTD
1 patentShowing the top 50 of 60 patents by PatentIndex Score.