P

Inventor

MAEDA KATSUMI

JP74 patents
⚠️ This page may combine multiple inventors who share the name “MAEDA KATSUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC CORP

40 patents
US5994025ANov 30, 1999

Photoresist, compounds for composing the photoresist, and method of forming pattern by using the photoresist

NEC CORP93 citations97
US7432035B2Oct 7, 2008

(Meth)acrylate derivative, polymer and photoresist composition having lactone structure, and method for forming pattern by using it

NEC CORP54 citations96
US7186495B2Mar 6, 2007

(Meth) acrylate derivative, polymer and photoresist composition having lactone structure, and method for forming pattern by using it

NEC CORP46 citations96
US5635332AJun 3, 1997

Alkylsulfonium salts and photoresist compositions containing the same

NEC CORP63 citations96
US6528232B1Mar 4, 2003

Sulfonium salt compound, photoresist composition and method for patterning by employing same

NEC CORP28 citations93
US6437052B1Aug 20, 2002

Monomer having diol structure, polymer thereof, and negative photoresist composition and pattern forming method using the same

NEC CORP29 citations93
US6352813B2Mar 5, 2002

Photosensitive resin composition and patterning method using the same

NEC CORP22 citations93
US6146806ANov 14, 2000

Negative photoresist composition using polymer having 1,2-diol structure and process for forming pattern using the same

NEC CORP36 citations93
US6140010AOct 31, 2000

Negative type photoresist composition used for light beam with short wavelength and method of forming pattern using the same

NEC CORP27 citations93
US6106998AAug 22, 2000

Negative resist materials, pattern formation method making use thereof, and method of manufacturing semiconductor devices

NEC CORP44 citations93
US6074801AJun 13, 2000

Negative type photoresist composition used for light beam with short wavelength and method of forming pattern using the same

NEC CORP41 citations93
US6030747AFeb 29, 2000

Chemically amplified resist large in transparency and sensitivity to exposure light less than 248 nanometer wavelength and process of forming mask

NEC CORP29 citations93
US5747622AMay 5, 1998

Polymer having silicon atoms and sulfonium salt units and photoresist compositions containing the same

NEC CORP21 citations93
US5585507ADec 17, 1996

Alkylsulfonium salts and photoresist compositions containing the same

NEC CORP35 citations93
US5770346AJun 23, 1998

Photoresist and compounds for composing the photoresist

NEC CORP18 citations92
US5665518ASep 9, 1997

Photoresist and monomer and polymer for composing the photoresist

NEC CORP36 citations92
US6639084B2Oct 28, 2003

Chemically amplified resist, polymer for the chemically amplified resist, monomer for the polymer and method for transferring pattern to chemically amplified resist layer

NEC CORP6 citations74
US6638685B2Oct 28, 2003

Photoacid generator containing two kinds of sulfonium salt compound, chemically amplified resist containing the same and pattern transfer method

NEC CORP9 citations74
US6602647B2Aug 5, 2003

Sulfonium salt compound and resist composition and pattern forming method using the same

NEC CORP11 citations74
US6559337B2May 6, 2003

(Meth)acrylate, polymer, photoresist composition, and pattern forming process making use of the composition

NEC CORP10 citations74
US6469197B1Oct 22, 2002

Negative photoresist composition using polymer having 1,2-diol structure and process for forming pattern using the same

NEC CORP8 citations74
US6391529B2May 21, 2002

(Meth)acrylate, polymer photoresist composition, and pattern forming process making use of the composition

NEC CORP12 citations74
US6287746B1Sep 11, 2001

Chemically amplified resist large in transparency and sensitivity to exposure light less than 248 nanometer wavelength and process of forming mask

NEC CORP12 citations74
US6248499B1Jun 19, 2001

(Meth)acrylate, polymer, photoresist composition, and pattern forming process making use of the composition

NEC CORP6 citations74
US5439990AAug 8, 1995

Photolytic polymer and photoresist composition

NEC CORP8 citations74
US5985522ANov 16, 1999

Photoresist and compounds for composing the photoresist

NEC CORP14 citations73
US10622678B2Apr 14, 2020

Lithium ion secondary battery

NEC CORP2 citations71
US12298245B2May 13, 2025

Detection device, assistance device and assistance method

NEC CORP0 citations63
US12113219B2Oct 8, 2024

Reduced graphene oxide-graphite composite material, method for producing same, and lithium ion secondary battery using same

NEC CORP0 citations63
US12054394B2Aug 6, 2024

Reduced graphene-based material

NEC CORP0 citations63
US10991940B2Apr 27, 2021

Graphite-based material for lithium ion secondary batteries and method for producing the same, and negative electrode and lithium ion secondary battery

NEC CORP0 citations63
US8969483B2Mar 3, 2015

(Meth)acrylate derivative, polymer and photoresist composition having lactone structure, and method for forming pattern by using it

NEC CORP2 citations63
US7847017B2Dec 7, 2010

Photosensitive resin composition for optical waveguide formation, optical waveguide and method for producing optical waveguide

NEC CORP3 citations63
US7378683B2May 27, 2008

Transistor using organic material having a bridged cyclic hydrocarbon lactone structure and process for producing the same

NEC CORP4 citations63
US7232639B2Jun 19, 2007

Monomer having fluorine-containing acetal or ketal structure, polymer thereof, and chemical-amplification-type resist composition as well as process for formation of pattern with use of the same

NEC CORP4 citations63
US6849384B2Feb 1, 2005

Photoacid generators, photoresist compositions containing the same and pattering method with the use of the compositions

NEC CORP4 citations63
US6746722B2Jun 8, 2004

Fluorine-containing phenylmaleimide derivative, polymer, chemically amplified resist composition, and method for pattern formation using the composition

NEC CORP2 citations63
US6710188B2Mar 23, 2004

Chemically amplified resist, polymer for the chemically amplified resist, monomer for the polymer and method for transferring pattern to chemically amplified resist layer

NEC CORP4 citations63
US10897062B2Jan 19, 2021

Lithium ion secondary battery

NEC CORP0 citations62
US11349152B2May 31, 2022

Carbon conductive additives for lithium ion battery

NEC CORP0 citations58

STAR MFG CO

3 patents

ECOLAB INC

1 patent

MORI KENTARO

1 patent

MINOLTA CAMERA KK

1 patent

DYNIC CORP

1 patent

STANLEY ELECTRIC CO LTD

1 patent

STANLEY ELECTRIC CO LTD TOKYO

1 patent

KIKUCHI KATSUMI

1 patent

Showing the top 50 of 74 patents by PatentIndex Score.