Inventor
HSIEH CHIA-TA
TW152 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH CHIA-TA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
49 patentsUS7910453B2Mar 22, 2011
Storage nitride encapsulation for non-planar sonos NAND flash charge retention
TAIWAN SEMICONDUCTOR MFG396 citations99
US6818512B1Nov 16, 2004
Split-gate flash with source/drain multi-sharing
TAIWAN SEMICONDUCTOR MFG70 citations96
US6380583B1Apr 30, 2002
Method to increase coupling ratio of source to floating gate in split-gate flash
TAIWAN SEMICONDUCTOR MFG46 citations96
US6228695B1May 8, 2001
Method to fabricate split-gate with self-aligned source and self-aligned floating gate to control gate
TAIWAN SEMICONDUCTOR MFG76 citations96
US6159801ADec 12, 2000
Method to increase coupling ratio of source to floating gate in split-gate flash
TAIWAN SEMICONDUCTOR MFG84 citations96
US6153494ANov 28, 2000
Method to increase the coupling ratio of word line to floating gate by lateral coupling in stacked-gate flash
TAIWAN SEMICONDUCTOR MFG70 citations96
US6117733ASep 12, 2000
Poly tip formation and self-align source process for split-gate flash cell
TAIWAN SEMICONDUCTOR MFG85 citations96
US6204126B1Mar 20, 2001
Method to fabricate a new structure with multi-self-aligned for split-gate flash
TAIWAN SEMICONDUCTOR MFG56 citations95
US6933555B2Aug 23, 2005
Flash EEPROM with function bit by bit erasing
TAIWAN SEMICONDUCTOR MFG37 citations93
US6876032B2Apr 5, 2005
Flash with finger-like floating gate
TAIWAN SEMICONDUCTOR MFG17 citations93
US6724036B1Apr 20, 2004
Stacked-gate flash memory cell with folding gate and increased coupling ratio
TAIWAN SEMICONDUCTOR MFG40 citations93
US6649472B1Nov 18, 2003
Method of manufacturing a flash memory cell with high programming efficiency by coupling from floating gate to sidewall
TAIWAN SEMICONDUCTOR MFG41 citations93
US6645813B1Nov 11, 2003
Flash EEPROM with function bit by bit erasing
TAIWAN SEMICONDUCTOR MFG40 citations93
US6593187B1Jul 15, 2003
Method to fabricate a square poly spacer in flash
TAIWAN SEMICONDUCTOR MFG33 citations93
US6579761B1Jun 17, 2003
Method to improve the coupling ratio of top gate to floating gate in flash
TAIWAN SEMICONDUCTOR MFG19 citations93
US6559501B2May 6, 2003
Method for forming split-gate flash cell for salicide and self-align contact
TAIWAN SEMICONDUCTOR MFG16 citations93
US6441429B1Aug 27, 2002
Split-gate flash memory device having floating gate electrode with sharp peak
TAIWAN SEMICONDUCTOR MFG24 citations93
US6417049B1Jul 9, 2002
Split gate flash cell for multiple storage
TAIWAN SEMICONDUCTOR MFG28 citations93
US6380035B1Apr 30, 2002
Poly tip formation and self-align source process for split-gate flash cell
TAIWAN SEMICONDUCTOR MFG19 citations93
US6355527B1Mar 12, 2002
Method to increase coupling ratio of source to floating gate in split-gate flash
TAIWAN SEMICONDUCTOR MFG28 citations93
US6284596B1Sep 4, 2001
Method of forming split-gate flash cell for salicide and self-align contact
TAIWAN SEMICONDUCTOR MFG39 citations93
US6249454B1Jun 19, 2001
Split-gate flash cell for virtual ground architecture
TAIWAN SEMICONDUCTOR MFG23 citations93
US6242308B1Jun 5, 2001
Method of forming poly tip to improve erasing and programming speed split gate flash
TAIWAN SEMICONDUCTOR MFG21 citations93
US6214662B1Apr 10, 2001
Forming self-align source line for memory array
TAIWAN SEMICONDUCTOR MFG27 citations93
US6174772B1Jan 16, 2001
Optimal process flow of fabricating nitride spacer without inter-poly oxide damage in split gate flash
TAIWAN SEMICONDUCTOR MFG16 citations93
US6165845ADec 26, 2000
Method to fabricate poly tip in split-gate flash
TAIWAN SEMICONDUCTOR MFG29 citations93
US6133097AOct 17, 2000
Method for forming mirror image split gate flash memory devices by forming a central source line slot
TAIWAN SEMICONDUCTOR MFG27 citations93
US6130132AOct 10, 2000
Clean process for manufacturing of split-gate flash memory device having floating gate electrode with sharp peak
TAIWAN SEMICONDUCTOR MFG29 citations93
US6127229AOct 3, 2000
Process of forming an EEPROM device having a split gate
TAIWAN SEMICONDUCTOR MFG36 citations93
US6093608AJul 25, 2000
Source side injection programming and tip erasing P-channel split gate flash memory cell
TAIWAN SEMICONDUCTOR MFG18 citations93
US6078076AJun 20, 2000
Vertical channels in split-gate flash memory cell
TAIWAN SEMICONDUCTOR MFG30 citations93
US6005809ADec 21, 1999
Program and erase method for a split gate flash EEPROM
TAIWAN SEMICONDUCTOR MFG33 citations93
US5976927ANov 2, 1999
Two mask method for reducing field oxide encroachment in memory arrays
TAIWAN SEMICONDUCTOR MFG23 citations93
US5972777AOct 26, 1999
Method of forming isolation by nitrogen implant to reduce bird's beak
TAIWAN SEMICONDUCTOR MFG24 citations93
US5970341AOct 19, 1999
Method for forming vertical channels in split-gate flash memory cell
TAIWAN SEMICONDUCTOR MFG20 citations93
US5858840AJan 12, 1999
Method of forming sharp beak of poly by nitrogen implant to improve erase speed for split-gate flash
TAIWAN SEMICONDUCTOR MFG37 citations93
US6753569B2Jun 22, 2004
Method to fabricate a non-smiling effect structure in split-gate flash with self-aligned isolation
TAIWAN SEMICONDUCTOR MFG18 citations92
US6538277B2Mar 25, 2003
Split-gate flash cell
TAIWAN SEMICONDUCTOR MFG23 citations92
US6403494B1Jun 11, 2002
Method of forming a floating gate self-aligned to STI on EEPROM
TAIWAN SEMICONDUCTOR MFG55 citations92
US6358796B1Mar 19, 2002
Method to fabricate a non-smiling effect structure in split-gate flash with self-aligned isolation
TAIWAN SEMICONDUCTOR MFG46 citations92
US6312989B1Nov 6, 2001
Structure with protruding source in split-gate flash
TAIWAN SEMICONDUCTOR MFG43 citations92
US6309928B1Oct 30, 2001
Split-gate flash cell
TAIWAN SEMICONDUCTOR MFG25 citations92
US6297099B1Oct 2, 2001
Method to free control tunneling oxide thickness on poly tip of flash
TAIWAN SEMICONDUCTOR MFG24 citations92
US6229176B1May 8, 2001
Split gate flash with step poly to improve program speed
TAIWAN SEMICONDUCTOR MFG37 citations92
US6124609ASep 26, 2000
Split gate flash memory with buried source to shrink cell dimension and increase coupling ratio
TAIWAN SEMICONDUCTOR MFG22 citations92
US6090668AJul 18, 2000
Method to fabricate sharp tip of poly in split gate flash
TAIWAN SEMICONDUCTOR MFG34 citations92
US6046086AApr 4, 2000
Method to improve the capacity of data retention and increase the coupling ratio of source to floating gate in split-gate flash
TAIWAN SEMICONDUCTOR MFG35 citations92
US6017795AJan 25, 2000
Method of fabricating buried source to shrink cell dimension and increase coupling ratio in split-gate flash
TAIWAN SEMICONDUCTOR MFG37 citations92
US5970371AOct 19, 1999
Method of forming sharp beak of poly to improve erase speed in split-gate flash EEPROM
TAIWAN SEMICONDUCTOR MFG31 citations92
HUNG CHIH-WEI
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