P

Inventor

HSIEH CHIA-TA

TW152 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH CHIA-TA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

49 patents
US7910453B2Mar 22, 2011

Storage nitride encapsulation for non-planar sonos NAND flash charge retention

TAIWAN SEMICONDUCTOR MFG396 citations99
US6818512B1Nov 16, 2004

Split-gate flash with source/drain multi-sharing

TAIWAN SEMICONDUCTOR MFG70 citations96
US6380583B1Apr 30, 2002

Method to increase coupling ratio of source to floating gate in split-gate flash

TAIWAN SEMICONDUCTOR MFG46 citations96
US6228695B1May 8, 2001

Method to fabricate split-gate with self-aligned source and self-aligned floating gate to control gate

TAIWAN SEMICONDUCTOR MFG76 citations96
US6159801ADec 12, 2000

Method to increase coupling ratio of source to floating gate in split-gate flash

TAIWAN SEMICONDUCTOR MFG84 citations96
US6153494ANov 28, 2000

Method to increase the coupling ratio of word line to floating gate by lateral coupling in stacked-gate flash

TAIWAN SEMICONDUCTOR MFG70 citations96
US6117733ASep 12, 2000

Poly tip formation and self-align source process for split-gate flash cell

TAIWAN SEMICONDUCTOR MFG85 citations96
US6204126B1Mar 20, 2001

Method to fabricate a new structure with multi-self-aligned for split-gate flash

TAIWAN SEMICONDUCTOR MFG56 citations95
US6933555B2Aug 23, 2005

Flash EEPROM with function bit by bit erasing

TAIWAN SEMICONDUCTOR MFG37 citations93
US6876032B2Apr 5, 2005

Flash with finger-like floating gate

TAIWAN SEMICONDUCTOR MFG17 citations93
US6724036B1Apr 20, 2004

Stacked-gate flash memory cell with folding gate and increased coupling ratio

TAIWAN SEMICONDUCTOR MFG40 citations93
US6649472B1Nov 18, 2003

Method of manufacturing a flash memory cell with high programming efficiency by coupling from floating gate to sidewall

TAIWAN SEMICONDUCTOR MFG41 citations93
US6645813B1Nov 11, 2003

Flash EEPROM with function bit by bit erasing

TAIWAN SEMICONDUCTOR MFG40 citations93
US6593187B1Jul 15, 2003

Method to fabricate a square poly spacer in flash

TAIWAN SEMICONDUCTOR MFG33 citations93
US6579761B1Jun 17, 2003

Method to improve the coupling ratio of top gate to floating gate in flash

TAIWAN SEMICONDUCTOR MFG19 citations93
US6559501B2May 6, 2003

Method for forming split-gate flash cell for salicide and self-align contact

TAIWAN SEMICONDUCTOR MFG16 citations93
US6441429B1Aug 27, 2002

Split-gate flash memory device having floating gate electrode with sharp peak

TAIWAN SEMICONDUCTOR MFG24 citations93
US6417049B1Jul 9, 2002

Split gate flash cell for multiple storage

TAIWAN SEMICONDUCTOR MFG28 citations93
US6380035B1Apr 30, 2002

Poly tip formation and self-align source process for split-gate flash cell

TAIWAN SEMICONDUCTOR MFG19 citations93
US6355527B1Mar 12, 2002

Method to increase coupling ratio of source to floating gate in split-gate flash

TAIWAN SEMICONDUCTOR MFG28 citations93
US6284596B1Sep 4, 2001

Method of forming split-gate flash cell for salicide and self-align contact

TAIWAN SEMICONDUCTOR MFG39 citations93
US6249454B1Jun 19, 2001

Split-gate flash cell for virtual ground architecture

TAIWAN SEMICONDUCTOR MFG23 citations93
US6242308B1Jun 5, 2001

Method of forming poly tip to improve erasing and programming speed split gate flash

TAIWAN SEMICONDUCTOR MFG21 citations93
US6214662B1Apr 10, 2001

Forming self-align source line for memory array

TAIWAN SEMICONDUCTOR MFG27 citations93
US6174772B1Jan 16, 2001

Optimal process flow of fabricating nitride spacer without inter-poly oxide damage in split gate flash

TAIWAN SEMICONDUCTOR MFG16 citations93
US6165845ADec 26, 2000

Method to fabricate poly tip in split-gate flash

TAIWAN SEMICONDUCTOR MFG29 citations93
US6133097AOct 17, 2000

Method for forming mirror image split gate flash memory devices by forming a central source line slot

TAIWAN SEMICONDUCTOR MFG27 citations93
US6130132AOct 10, 2000

Clean process for manufacturing of split-gate flash memory device having floating gate electrode with sharp peak

TAIWAN SEMICONDUCTOR MFG29 citations93
US6127229AOct 3, 2000

Process of forming an EEPROM device having a split gate

TAIWAN SEMICONDUCTOR MFG36 citations93
US6093608AJul 25, 2000

Source side injection programming and tip erasing P-channel split gate flash memory cell

TAIWAN SEMICONDUCTOR MFG18 citations93
US6078076AJun 20, 2000

Vertical channels in split-gate flash memory cell

TAIWAN SEMICONDUCTOR MFG30 citations93
US6005809ADec 21, 1999

Program and erase method for a split gate flash EEPROM

TAIWAN SEMICONDUCTOR MFG33 citations93
US5976927ANov 2, 1999

Two mask method for reducing field oxide encroachment in memory arrays

TAIWAN SEMICONDUCTOR MFG23 citations93
US5972777AOct 26, 1999

Method of forming isolation by nitrogen implant to reduce bird's beak

TAIWAN SEMICONDUCTOR MFG24 citations93
US5970341AOct 19, 1999

Method for forming vertical channels in split-gate flash memory cell

TAIWAN SEMICONDUCTOR MFG20 citations93
US5858840AJan 12, 1999

Method of forming sharp beak of poly by nitrogen implant to improve erase speed for split-gate flash

TAIWAN SEMICONDUCTOR MFG37 citations93
US6753569B2Jun 22, 2004

Method to fabricate a non-smiling effect structure in split-gate flash with self-aligned isolation

TAIWAN SEMICONDUCTOR MFG18 citations92
US6538277B2Mar 25, 2003

Split-gate flash cell

TAIWAN SEMICONDUCTOR MFG23 citations92
US6403494B1Jun 11, 2002

Method of forming a floating gate self-aligned to STI on EEPROM

TAIWAN SEMICONDUCTOR MFG55 citations92
US6358796B1Mar 19, 2002

Method to fabricate a non-smiling effect structure in split-gate flash with self-aligned isolation

TAIWAN SEMICONDUCTOR MFG46 citations92
US6312989B1Nov 6, 2001

Structure with protruding source in split-gate flash

TAIWAN SEMICONDUCTOR MFG43 citations92
US6309928B1Oct 30, 2001

Split-gate flash cell

TAIWAN SEMICONDUCTOR MFG25 citations92
US6297099B1Oct 2, 2001

Method to free control tunneling oxide thickness on poly tip of flash

TAIWAN SEMICONDUCTOR MFG24 citations92
US6229176B1May 8, 2001

Split gate flash with step poly to improve program speed

TAIWAN SEMICONDUCTOR MFG37 citations92
US6124609ASep 26, 2000

Split gate flash memory with buried source to shrink cell dimension and increase coupling ratio

TAIWAN SEMICONDUCTOR MFG22 citations92
US6090668AJul 18, 2000

Method to fabricate sharp tip of poly in split gate flash

TAIWAN SEMICONDUCTOR MFG34 citations92
US6046086AApr 4, 2000

Method to improve the capacity of data retention and increase the coupling ratio of source to floating gate in split-gate flash

TAIWAN SEMICONDUCTOR MFG35 citations92
US6017795AJan 25, 2000

Method of fabricating buried source to shrink cell dimension and increase coupling ratio in split-gate flash

TAIWAN SEMICONDUCTOR MFG37 citations92
US5970371AOct 19, 1999

Method of forming sharp beak of poly to improve erase speed in split-gate flash EEPROM

TAIWAN SEMICONDUCTOR MFG31 citations92

HUNG CHIH-WEI

1 patent

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