Inventor
CHEN WEI-FAN
TW55 patents
⚠️ This page may combine multiple inventors who share the name “CHEN WEI-FAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WINBOND ELECTRONICS CORP
32 patentsUS7034363B2Apr 25, 2006
Bi-directional EOS/ESD protection device
WINBOND ELECTRONICS CORP68 citations98
US6919602B2Jul 19, 2005
Gate-coupled MOSFET ESD protection circuit
WINBOND ELECTRONICS CORP81 citations98
US6287931B1Sep 11, 2001
Method of fabricating on-chip inductor
WINBOND ELECTRONICS CORP115 citations98
US7072161B2Jul 4, 2006
High ESD stress sustaining ESD protection circuit
WINBOND ELECTRONICS CORP28 citations93
US6759691B2Jul 6, 2004
ESD protection circuit having a high triggering threshold
WINBOND ELECTRONICS CORP27 citations93
US6556398B1Apr 29, 2003
Voltage tolerance ESD protection circuit
WINBOND ELECTRONICS CORP25 citations93
US6486692B1Nov 26, 2002
Method of positive mobile iron contamination (PMIC) detection and apparatus of performing the same
WINBOND ELECTRONICS CORP23 citations93
US6281527B1Aug 28, 2001
Electrostatic discharge protection circuit with high trigger current
WINBOND ELECTRONICS CORP44 citations93
US6246079B1Jun 12, 2001
SCR circuit with a high trigger current
WINBOND ELECTRONICS CORP27 citations93
US6172403B1Jan 9, 2001
Electrostatic discharge protection circuit triggered by floating-base transistor
WINBOND ELECTRONICS CORP39 citations93
US7009252B2Mar 7, 2006
ESD protection devices and methods for reducing trigger voltage
WINBOND ELECTRONICS CORP42 citations91
US6958896B2Oct 25, 2005
Early triggered ESD MOSFET protection circuit and method thereof
WINBOND ELECTRONICS CORP22 citations91
US6573568B2Jun 3, 2003
ESD protection devices and methods for reducing trigger voltage
WINBOND ELECTRONICS CORP18 citations91
US6147369ANov 14, 2000
SCR and current divider structure of electrostatic discharge protective circuit
WINBOND ELECTRONICS CORP32 citations91
US6696708B2Feb 24, 2004
Electrostatic discharge protection apparatus
WINBOND ELECTRONICS CORP28 citations90
US6864536B2Mar 8, 2005
Electrostatic discharge protection circuit
WINBOND ELECTRONICS CORP49 citations89
US7012307B2Mar 14, 2006
Output buffer with good ESD protection
WINBOND ELECTRONICS CORP15 citations84
US6858900B2Feb 22, 2005
ESD protection devices and methods to reduce trigger voltage
WINBOND ELECTRONICS CORP14 citations84
US6844595B2Jan 18, 2005
Electrostatic discharge protection circuit with high triggering voltage
WINBOND ELECTRONICS CORP17 citations84
US6720623B2Apr 13, 2004
ESD protection device coupled between two high power lines
WINBOND ELECTRONICS CORP14 citations84
US6542346B1Apr 1, 2003
High-voltage tolerance input buffer and ESD protection circuit
WINBOND ELECTRONICS CORP19 citations84
US6510088B2Jan 21, 2003
Semiconductor device having reduced leakage and method of operating the same
WINBOND ELECTRONICS CORP17 citations82
US6838708B2Jan 4, 2005
I/O cell and ESD protection circuit
WINBOND ELECTRONICS CORP8 citations74
US6664599B1Dec 16, 2003
ESD protection device
WINBOND ELECTRONICS CORP11 citations74
US6560080B1May 6, 2003
Low-voltage triggered ESD protection circuit
WINBOND ELECTRONICS CORP8 citations74
US6344995B2Feb 5, 2002
Circuit for controlling the potential difference between the substrate and the control gate on non-volatile memory and its control method
WINBOND ELECTRONICS CORP7 citations74
US6229185B1May 8, 2001
CMOS integrated circuit for lessening latch-up susceptibility
WINBOND ELECTRONICS CORP9 citations74
US6740570B2May 25, 2004
Method for forming a self-aligned silicide of a metal oxide semiconductor
WINBOND ELECTRONICS CORP8 citations73
US6493199B1Dec 10, 2002
Vertical zener-triggered SCR structure for ESD protection in integrated circuits
WINBOND ELECTRONICS CORP12 citations72
US7256461B2Aug 14, 2007
Electrostatic discharge (ESD) protection device
WINBOND ELECTRONICS CORP3 citations63
US6850440B2Feb 1, 2005
Method for improved programming efficiency in flash memory cells
WINBOND ELECTRONICS CORP2 citations63
US7075154B2Jul 11, 2006
Electrostatic discharge protection device
WINBOND ELECTRONICS CORP1 citations52
LEAP SEMICONDUCTOR CORP
9 patentsUS12341513B2Jun 24, 2025
Driving voltage generating device
LEAP SEMICONDUCTOR CORP0 citations60
US12191403B2Jan 7, 2025
Method of manufacturing merged PiN Schottky (MPS) diode
LEAP SEMICONDUCTOR CORP0 citations60
US12154991B2Nov 26, 2024
Method of manufacturing wide-band gap semiconductor device
LEAP SEMICONDUCTOR CORP0 citations60
US12095254B2Sep 17, 2024
Electronic device and temperature detection device thereof
LEAP SEMICONDUCTOR CORP0 citations60
US12068742B2Aug 20, 2024
Short-circuit protection circuitry
LEAP SEMICONDUCTOR CORP0 citations60
US11990553B2May 21, 2024
Merged PiN Schottky (MPS) diode and method of manufacturing the same
LEAP SEMICONDUCTOR CORP0 citations60
US11955567B2Apr 9, 2024
Wide-band gap semiconductor device and method of manufacturing the same
LEAP SEMICONDUCTOR CORP0 citations60
US12442695B2Oct 14, 2025
Temperature sensing device
LEAP SEMICONDUCTOR CORP0 citations49
US12402390B2Aug 26, 2025
Method of manufacturing silicon carbide semiconductor power device
LEAP SEMICONDUCTOR CORP0 citations49
NANYA TECHNOLOGY CORP
2 patentsHTC CORP
2 patentsUS12394094B1Aug 19, 2025
Extrinsic calibration parameter generating device, method, and non-transitory computer readable storage medium thereof
HTC CORP1 citations64
US12149802B2Nov 19, 2024
Real-world view display method, video pass-through system and non-transitory computer readable storage medium
HTC CORP1 citations63
WINBOND ELECTRONIC CORP
1 patentWINDBOND ELECTRONICS CORP
1 patentCHEN WEI-FAN
1 patentADLINK TECH INC
1 patentPIECEMAKERS TECH INC
1 patentShowing the top 50 of 55 patents by PatentIndex Score.