Inventor

MCNICHOLS JASON W

US2 patents

⚠️ This page may combine multiple inventors who share the name “MCNICHOLS JASON W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LSI CORP

1 patent

US7968859B2Jun 28, 2011

Wafer edge defect inspection using captured image analysis

LSI CORP27 citations87

LSI LOGIC CORP

1 patent

US7315360B2Jan 1, 2008

Surface coordinate system

LSI LOGIC CORP2 citations57