Inventor
BROWN BRIAN L
US16 patents
⚠️ This page may combine multiple inventors who share the name “BROWN BRIAN L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
11 patentsUS6351427B1Feb 26, 2002
Stored write scheme for high speed/wide bandwidth memory devices
TEXAS INSTRUMENTS INC68 citations96
US6208570B1Mar 27, 2001
Redundancy test method for a semiconductor memory
TEXAS INSTRUMENTS INC35 citations92
US6049241AApr 11, 2000
Clock skew circuit
TEXAS INSTRUMENTS INC27 citations92
US6005430ADec 21, 1999
Clock skew circuit
TEXAS INSTRUMENTS INC24 citations92
US5557219ASep 17, 1996
Interface level programmability
TEXAS INSTRUMENTS INC29 citations92
US5440248AAug 8, 1995
Power-saver differential input buffer
TEXAS INSTRUMENTS INC19 citations82
US5910923AJun 8, 1999
Memory access circuits for test time reduction
TEXAS INSTRUMENTS INC9 citations74
US6028811AFeb 22, 2000
Architecture for high bandwidth wide I/O memory devices
TEXAS INSTRUMENTS INC9 citations73
US6615391B2Sep 2, 2003
Current controlled multi-state parallel test for semiconductor device
TEXAS INSTRUMENTS INC9 citations70
US6408411B1Jun 18, 2002
Two pass multi-state parallel test for semiconductor device
TEXAS INSTRUMENTS INC4 citations59
US6381718B1Apr 30, 2002
Current controlled multi-state parallel test for semiconductor device
TEXAS INSTRUMENTS INC4 citations59
MICRON TECHNOLOGY INC
5 patentsUS6233190B1May 15, 2001
Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuit
MICRON TECHNOLOGY INC57 citations96
US6778453B2Aug 17, 2004
Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuit
MICRON TECHNOLOGY INC32 citations92
US6552945B2Apr 22, 2003
Method for storing a temperature threshold in an integrated circuit, method for storing a temperature threshold in a dynamic random access memory, method of modifying dynamic random access memory operation in response to temperature, programmable temperature sensing circuit and memory integrated circuit
MICRON TECHNOLOGY INC30 citations92
US6314036B1Nov 6, 2001
Method and apparatus for efficiently testing RAMBUS memory devices
MICRON TECHNOLOGY INC17 citations92
US6144598ANov 7, 2000
Method and apparatus for efficiently testing rambus memory devices
MICRON TECHNOLOGY INC34 citations92