Inventor

DIEP JEFFREY

US2 patents

Patents

2 patents

US7459677B2Dec 2, 2008

Mass spectrometer for trace gas leak detection with suppression of undesired ions

VARIAN INC7 citations69

US7427751B2Sep 23, 2008

High sensitivity slitless ion source mass spectrometer for trace gas leak detection

VARIAN INC4 citations58