Inventor
NISHITA NOBUYUKI
JP69 patents
⚠️ This page may combine multiple inventors who share the name “NISHITA NOBUYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
37 patentsUS11536568B2Dec 27, 2022
Target instrument and surveying system
TOPCON CORP11 citations86
US10895632B2Jan 19, 2021
Surveying system
TOPCON CORP7 citations84
US10810889B2Oct 20, 2020
Operating device, operating method, operating system, and operating program
TOPCON CORP8 citations82
US12152880B2Nov 26, 2024
Surveying system, point cloud data acquiring method, and point cloud data acquiring program
TOPCON CORP2 citations73
US11822351B2Nov 21, 2023
Three-dimensional information processing unit, apparatus having three-dimensional information processing unit, unmanned aerial vehicle, informing device, method and program for controlling mobile body using three-dimensional information processing unit
TOPCON CORP3 citations73
US11585900B2Feb 21, 2023
Reflecting prism, measurement target object including reflecting prism, surveying device, coordinate comparing section, surveying method, and surveying processing program
TOPCON CORP2 citations73
US11500096B2Nov 15, 2022
Surveying instrument
TOPCON CORP4 citations73
US11460299B2Oct 4, 2022
Survey system
TOPCON CORP4 citations73
US10809379B2Oct 20, 2020
Three-dimensional position measuring system, three-dimensional position measuring method, and measuring module
TOPCON CORP2 citations73
US10605600B2Mar 31, 2020
Surveying system
TOPCON CORP2 citations73
US10565730B2Feb 18, 2020
Survey data processing device, survey data processing method, and survey data processing program
TOPCON CORP3 citations73
US10488519B2Nov 26, 2019
Polygon mirror, fan beam output device, and survey system
TOPCON CORP6 citations73
US10337863B2Jul 2, 2019
Survey system
TOPCON CORP3 citations73
US10724860B2Jul 28, 2020
Surveying device and survey system
TOPCON CORP5 citations71
USD977999SFeb 14, 2023
Prism for measuring
TOPCON CORP1 citations70
US12013239B2Jun 18, 2024
Marking system and marking method
TOPCON CORP1 citations63
US11754677B2Sep 12, 2023
Measurement device
TOPCON CORP0 citations62
US11719537B2Aug 8, 2023
Leveling base, surveying instrument and surveying system
TOPCON CORP0 citations62
US11630186B2Apr 18, 2023
Target device and measuring system
TOPCON CORP0 citations62
US11333764B2May 17, 2022
Survey system
TOPCON CORP1 citations62
US11009607B2May 18, 2021
Surveying system
TOPCON CORP1 citations62
US10795365B2Oct 6, 2020
Movable body photogrammetry survey system
TOPCON CORP1 citations62
US10708572B2Jul 7, 2020
Photogrammetric system and photogrammetric method
TOPCON CORP1 citations62
USD1113466SFeb 17, 2026
Prism for measuring
TOPCON CORP0 citations59
US12392610B2Aug 19, 2025
Reference point indicating apparatus
TOPCON CORP0 citations55
US12560276B2Feb 24, 2026
Target support tool
TOPCON CORP0 citations54
US12359915B2Jul 15, 2025
Surveying instrument and surveying system
TOPCON CORP0 citations52
US12235104B2Feb 25, 2025
Measurement device and method for controlling measurement device
TOPCON CORP0 citations52
US12000701B2Jun 4, 2024
Surveying instrument, pole having a reflective peripheral surface and surveying system having trigger device for irradiating a laser point along an axis of the pole
TOPCON CORP0 citations52
US11940274B2Mar 26, 2024
Tilt detecting device and surveying instrument
TOPCON CORP0 citations52
US11668825B2Jun 6, 2023
Measurement apparatus and control method of measurement apparatus
TOPCON CORP0 citations52
US11644575B2May 9, 2023
Surveying device and surveying method
TOPCON CORP0 citations52
US11630208B2Apr 18, 2023
Measurement system, measurement method, and measurement program
TOPCON CORP0 citations52
US11460297B2Oct 4, 2022
Measurement apparatus and control method of measurement apparatus
TOPCON CORP0 citations52
US11448504B2Sep 20, 2022
Surveying device
TOPCON CORP0 citations52
US11385052B2Jul 12, 2022
Surveying instrument
TOPCON CORP0 citations52
US11307031B2Apr 19, 2022
Surveying device, and calibration checking method and calibration checking program for surveying device
TOPCON CORP0 citations52
KK TOPCON
7 patentsUS10264221B2Apr 16, 2019
Measurement system, measurement method, survey machine, and reflection target for measurement
KK TOPCON8 citations82
US9797719B2Oct 24, 2017
Measuring method and measuring instrument
KK TOPCON2 citations73
US9776320B2Oct 3, 2017
Measurement and installation data indicating apparatus and measurement and installation data indicating method
KK TOPCON4 citations73
US9605957B2Mar 28, 2017
Surveying instrument and method to install surveying instrument
KK TOPCON6 citations73
US9581442B2Feb 28, 2017
Surveying instrument
KK TOPCON2 citations73
US9945665B2Apr 17, 2018
Surveying instrument
KK TOPCON3 citations71
US9618340B2Apr 11, 2017
Surveying instrument
KK TOPCON2 citations71
SOKKIA CO LTD
4 patentsUS7304729B2Dec 4, 2007
Survey system
SOKKIA CO LTD57 citations95
US7446863B2Nov 4, 2008
Automatic collimation device for surveying apparatus
SOKKIA CO LTD44 citations92
US7321420B2Jan 22, 2008
Survey system
SOKKIA CO LTD40 citations92
US7361874B2Apr 22, 2008
Auto focusing mechanism of surveying instrument
SOKKIA CO LTD2 citations62
NISHITA NOBUYUKI
2 patentsShowing the top 50 of 69 patents by PatentIndex Score.