Inventor
KNOX MARC D
US17 patents
⚠️ This page may combine multiple inventors who share the name “KNOX MARC D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
15 patentsUS7400162B2Jul 15, 2008
Integrated circuit testing methods using well bias modification
IBM17 citations90
US6504392B2Jan 7, 2003
Actively controlled heat sink for convective burn-in oven
IBM38 citations89
US7567090B2Jul 28, 2009
Liquid recovery, collection method and apparatus in a non-recirculating test and burn-in application
IBM9 citations80
US6577146B2Jun 10, 2003
Method of burning in an integrated circuit chip package
IBM16 citations79
US7259580B2Aug 21, 2007
Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test
IBM15 citations78
US10261108B2Apr 16, 2019
Low force wafer test probe with variable geometry
IBM3 citations72
US7759960B2Jul 20, 2010
Integrated circuit testing methods using well bias modification
IBM7 citations72
US11029334B2Jun 8, 2021
Low force wafer test probe
IBM0 citations61
US7486098B2Feb 3, 2009
Integrated circuit testing method using well bias modification
IBM4 citations60
US9269603B2Feb 23, 2016
Temporary liquid thermal interface material for surface tension adhesion and thermal control
IBM2 citations59
US10663487B2May 26, 2020
Low force wafer test probe with variable geometry
IBM0 citations51
US10444260B2Oct 15, 2019
Low force wafer test probe
IBM0 citations51
US9437670B2Sep 6, 2016
Light activated test connections
IBM0 citations49
US7265561B2Sep 4, 2007
Device burn in utilizing voltage control
IBM1 citations49
US7332927B2Feb 19, 2008
Apparatus for temporary thermal coupling of an electronic device to a heat sink during test
IBM0 citations45