Inventor
NIGH PHIL
US8 patents
⚠️ This page may combine multiple inventors who share the name “NIGH PHIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
7 patentsUS5982189ANov 9, 1999
Built-in dynamic stress for integrated circuits
IBM89 citations92
US7400162B2Jul 15, 2008
Integrated circuit testing methods using well bias modification
IBM17 citations90
US5942911AAug 24, 1999
Electric field test of integrated circuit component
IBM27 citations90
US5807763ASep 15, 1998
Electric field test of integrated circuit component
IBM34 citations90
US7759960B2Jul 20, 2010
Integrated circuit testing methods using well bias modification
IBM7 citations72
US7486098B2Feb 3, 2009
Integrated circuit testing method using well bias modification
IBM4 citations60
US7428675B2Sep 23, 2008
Testing using independently controllable voltage islands
IBM5 citations59