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Inventor
KANG TING-KUO
TW
2 patents
Patents
2 patents
US7019545B2
Mar 28, 2006
Method for monitoring quality of an insulation layer
UNITED MICROELECTRONICS CORP
9 citations
70
US6894517B2
May 17, 2005
Method for monitoring oxide quality
UNITED MICROELECTRONICS CORP
8 citations
70