Inventor

NORTON ADAM E

US38 patents

⚠️ This page may combine multiple inventors who share the name “NORTON ADAM E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NORTON ADAM E

GOOGLE INC

Optical configurations in a tileable display apparatus

High contrast projection screen with stray light rejection

Rear projection screen with pin-hole concentrator array

High contrast rear projection screen

Masking mechanical separations between tiled display panels

Tileable display with pixel-tape

Free space optical combiner with prescription integration

Optical configurations in a tileable display apparatus

Multi-domain pixel array

Dual sided lens array using clear beads

TOKYO ELECTRON LTD

Method and apparatus to reduce spotsize in an optical metrology instrument

Polarimetric scatterometry methods for critical dimension measurements of periodic structures

Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor

Method and apparatus for position-dependent optical metrology calibration

Polarimetric scatterometry methods for critical dimension measurements of periodic structures

Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor

Method and apparatus for position-dependent optical metrology calibration

Method and apparatus for position-dependent optical metrology calibration

Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor

THERMA WAVE INC

Spectroscopic ellipsometer without rotating components

Polarimetric scatterometer for critical dimension measurements of periodic structures

Polarimetric scatterometry methods for critical dimension measurements of periodic structures

Aperture to reduce sensitivity to sample tilt in small spotsize reflectometers

Wafer metrology apparatus and method

KLA TENCOR CORP

Spectroscopic measurement system using an off-axis spherical mirror and refractive elements

Spectroscopic measurement system using curved mirror

Apodizing filter system useful for reducing spot size in optical measurements and other applications

SENSYS INSTR CORP

Notch and flat sensor for wafer alignment

Small-spot spectrometry instrument with reduced polarization

Bathless wafer measurement apparatus and method

X DEV LLC

Optical configurations in a tileable display apparatus

High contrast projection screen with stray light rejection

Bright edge display for seamless tileable display panels

PROMETRIX CORP

Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness

KLA TENCOP CORP

Broadband microspectro-reflectometer

GOOGLE LLC

Lightguide optical combiner for head wearable display

KLA TENCOR TECHNOLOGIES

Broadband wavelength selective filter

(unassigned)

Spectroscopic measurement system using an off-axis spherical mirror and refractive elements