Inventor
SEZGINER ABDURRAHMAN
US109 patents
⚠️ This page may combine multiple inventors who share the name “SEZGINER ABDURRAHMAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SCHLUMBERGER TECHNOLOGY CORP
27 patentsUS5705927AJan 6, 1998
Pulsed nuclear magnetism tool for formation evaluation while drilling including a shortened or truncated CPMG sequence
SCHLUMBERGER TECHNOLOGY CORP145 citations99
US5629623AMay 13, 1997
Pulsed nuclear magnetism tool for formation evaluation while drilling
SCHLUMBERGER TECHNOLOGY CORP142 citations99
US5055788AOct 8, 1991
Borehole measurement of NMR characteristics of earth formations
SCHLUMBERGER TECHNOLOGY CORP143 citations99
US5557201ASep 17, 1996
Pulsed nuclear magnetism tool for formation evaluation while drilling
SCHLUMBERGER TECHNOLOGY CORP119 citations98
US5363041ANov 8, 1994
Determining bound and unbound fluid volumes using nuclear magnetic resonance pulse sequences
SCHLUMBERGER TECHNOLOGY CORP125 citations98
US5055787AOct 8, 1991
Borehole measurement of NMR characteristics of earth formations
SCHLUMBERGER TECHNOLOGY CORP206 citations98
US6691779B1Feb 17, 2004
Wellbore antennae system and method
SCHLUMBERGER TECHNOLOGY CORP113 citations97
US6522137B1Feb 18, 2003
Two-dimensional magnetic resonance imaging in a borehole
SCHLUMBERGER TECHNOLOGY CORP140 citations97
US6107797AAug 22, 2000
Magnetic resonance logging apparatus and method
SCHLUMBERGER TECHNOLOGY CORP33 citations96
US5977768ANov 2, 1999
Nuclear magnetic resonance logging with azimuthal resolution
SCHLUMBERGER TECHNOLOGY CORP83 citations96
US5914598AJun 22, 1999
Pulsed nuclear magnetism tool for formation evaluation while drilling
SCHLUMBERGER TECHNOLOGY CORP60 citations96
US5796252AAug 18, 1998
Nuclear magnetic resonance borehole logging apparatus and method for ascertaining a volume of hydrocarbons independent of a diffusion coefficient
SCHLUMBERGER TECHNOLOGY CORP163 citations96
US5486761AJan 23, 1996
Nuclear magnetic resonance measuring apparatus
SCHLUMBERGER TECHNOLOGY CORP60 citations96
US5376884ADec 27, 1994
Nuclear magnetic resonance measuring apparatus
SCHLUMBERGER TECHNOLOGY CORP61 citations96
US6008646ADec 28, 1999
Apparatus for protecting a magnetic resonance antenna
SCHLUMBERGER TECHNOLOGY CORP56 citations95
US6534980B2Mar 18, 2003
Downhole NMR tool antenna design
SCHLUMBERGER TECHNOLOGY CORP50 citations94
US6166543ADec 26, 2000
Method and apparatus for measuring nuclear magnetic resonance
SCHLUMBERGER TECHNOLOGY CORP58 citations94
US6255818B1Jul 3, 2001
Method and apparatus for performing magnetic resonance measurements
SCHLUMBERGER TECHNOLOGY CORP63 citations93
US6023163AFeb 8, 2000
Well logging method and apparatus for determining gas and diffusion coefficient using NMR
SCHLUMBERGER TECHNOLOGY CORP49 citations93
US5596274AJan 21, 1997
Determining bound and unbound fluid volumes using nuclear magnetic resonance pulse sequences
SCHLUMBERGER TECHNOLOGY CORP54 citations93
US6781371B2Aug 24, 2004
High vertical resolution antennas for NMR logging
SCHLUMBERGER TECHNOLOGY CORP24 citations92
US6559639B2May 6, 2003
Estimating permeability without determinating a distribution of relaxation times
SCHLUMBERGER TECHNOLOGY CORP23 citations92
US6459992B1Oct 1, 2002
Method and apparatus for determining logging tool displacements
SCHLUMBERGER TECHNOLOGY CORP38 citations92
US5153514AOct 6, 1992
Antenna and wear plates for borehole logging apparatus
SCHLUMBERGER TECHNOLOGY CORP41 citations92
US6919724B2Jul 19, 2005
Method and apparatus for investigating the wall of a borehole
SCHLUMBERGER TECHNOLOGY CORP24 citations91
US6573716B2Jun 3, 2003
Method and apparatus for tuning an NMR coil
SCHLUMBERGER TECHNOLOGY CORP18 citations91
US6400147B1Jun 4, 2002
Downhole NMR tool having a programmable pulse sequencer
SCHLUMBERGER TECHNOLOGY CORP32 citations91
TOKYO ELECTRON LTD
8 patentsUS7042569B2May 9, 2006
Overlay alignment metrology using diffraction gratings
TOKYO ELECTRON LTD70 citations98
US6985232B2Jan 10, 2006
Scatterometry by phase sensitive reflectometer
TOKYO ELECTRON LTD85 citations98
US7333200B2Feb 19, 2008
Overlay metrology method and apparatus using more than one grating per measurement direction
TOKYO ELECTRON LTD30 citations93
US7170604B2Jan 30, 2007
Overlay metrology method and apparatus using more than one grating per measurement direction
TOKYO ELECTRON LTD35 citations93
US7088451B2Aug 8, 2006
Scatterometry by phase sensitive reflectometer
TOKYO ELECTRON LTD42 citations93
US7230703B2Jun 12, 2007
Apparatus and method for measuring overlay by diffraction gratings
TOKYO ELECTRON LTD38 citations92
US7230704B2Jun 12, 2007
Diffracting, aperiodic targets for overlay metrology and method to detect gross overlay
TOKYO ELECTRON LTD29 citations92
US7193715B2Mar 20, 2007
Measurement of overlay using diffraction gratings when overlay exceeds the grating period
TOKYO ELECTRON LTD46 citations92
CADENCE DESIGN SYSTEMS INC
5 patentsUS7480891B2Jan 20, 2009
Method and apparatus of model-based photomask synthesis
CADENCE DESIGN SYSTEMS INC248 citations99
US7568174B2Jul 28, 2009
Method for checking printability of a lithography target
CADENCE DESIGN SYSTEMS INC185 citations98
US7506300B2Mar 17, 2009
Apparatus and method for breaking up and merging polygons
CADENCE DESIGN SYSTEMS INC232 citations97
US7856613B1Dec 21, 2010
Method for self-aligned doubled patterning lithography
CADENCE DESIGN SYSTEMS INC31 citations92
US7849423B1Dec 7, 2010
Method of verifying photomask data based on models of etch and lithography processes
CADENCE DESIGN SYSTEMS INC61 citations92
THERMA WAVE INC
5 patentsUS7046376B2May 16, 2006
Overlay targets with isolated, critical-dimension features and apparatus to measure overlay
THERMA WAVE INC159 citations99
US6819426B2Nov 16, 2004
Overlay alignment metrology using diffraction gratings
THERMA WAVE INC373 citations99
US6753961B1Jun 22, 2004
Spectroscopic ellipsometer without rotating components
THERMA WAVE INC154 citations99
US6778273B2Aug 17, 2004
Polarimetric scatterometer for critical dimension measurements of periodic structures
THERMA WAVE INC51 citations96
US6909507B2Jun 21, 2005
Polarimetric scatterometry methods for critical dimension measurements of periodic structures
THERMA WAVE INC12 citations93
(unassigned)
2 patentsINVARIUM INC
1 patentSCHLUMBERGER DOLL RESEARCH
1 patentKLA TENCOR CORP
1 patentShowing the top 50 of 109 patents by PatentIndex Score.