Inventor
FURMAN DOV
IL23 patents
⚠️ This page may combine multiple inventors who share the name “FURMAN DOV”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEGEVTECH LTD
7 patentsUS7525659B2Apr 28, 2009
System for detection of water defects
NEGEVTECH LTD13 citations92
US7274444B2Sep 25, 2007
Multi mode inspection method and apparatus
NEGEVTECH LTD17 citations92
US6892013B2May 10, 2005
Fiber optical illumination system
NEGEVTECH LTD32 citations92
US7477383B2Jan 13, 2009
System for detection of wafer defects
NEGEVTECH LTD5 citations73
US7260298B2Aug 21, 2007
Fiber optical illumination system
NEGEVTECH LTD6 citations73
US7486861B2Feb 3, 2009
Fiber optical illumination system
NEGEVTECH LTD1 citations51
US7480039B2Jan 20, 2009
Multi mode inspection method and apparatus
NEGEVTECH LTD0 citations51
APPLIED MATERIALS SOUTH EAST A
6 patentsUS7633041B2Dec 15, 2009
Apparatus for determining optimum position of focus of an imaging system
APPLIED MATERIALS SOUTH EAST A20 citations92
US7719674B2May 18, 2010
Image splitting in optical inspection systems
APPLIED MATERIALS SOUTH EAST A29 citations89
US7714998B2May 11, 2010
Image splitting in optical inspection systems
APPLIED MATERIALS SOUTH EAST A34 citations89
US7804993B2Sep 28, 2010
Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images
APPLIED MATERIALS SOUTH EAST A15 citations80
US7826049B2Nov 2, 2010
Inspection tools supporting multiple operating states for multiple detector arrangements
APPLIED MATERIALS SOUTH EAST A4 citations62
US7804590B2Sep 28, 2010
Multi mode inspection method and apparatus
APPLIED MATERIALS SOUTH EAST A0 citations51
APPLIED MATERIALS SEA PTE LTD
3 patentsUS7961763B2Jun 14, 2011
System for detection of wafer defects
APPLIED MATERIALS SEA PTE LTD14 citations92
US7843558B2Nov 30, 2010
Optical inspection tools featuring light shaping diffusers
APPLIED MATERIALS SEA PTE LTD14 citations83
US7843559B2Nov 30, 2010
System for detection of wafer defects
APPLIED MATERIALS SEA PTE LTD7 citations73