Inventor
MATSUO KOUJI
JP70 patents
⚠️ This page may combine multiple inventors who share the name “MATSUO KOUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
27 patentsUS6376888B1Apr 23, 2002
Semiconductor device and method of manufacturing the same
TOSHIBA KK175 citations99
US6310367B1Oct 30, 2001
MOS transistor having a tensile-strained SI layer and a compressive-strained SI-GE layer
TOSHIBA KK213 citations99
US6465290B1Oct 15, 2002
Method of manufacturing a semiconductor device using a polymer film pattern
TOSHIBA KK88 citations98
US6346438B1Feb 12, 2002
Method of manufacturing a semiconductor device
TOSHIBA KK91 citations98
US6977415B2Dec 20, 2005
Semiconductor device including a gate insulating film on a recess and source and drain extension regions
TOSHIBA KK54 citations96
US7652328B2Jan 26, 2010
Semiconductor device and method of manufacturing the same
TOSHIBA KK32 citations93
US7579231B2Aug 25, 2009
Semiconductor device and method of manufacturing the same
TOSHIBA KK29 citations93
US7179569B2Feb 20, 2007
Method for manufacturing a semiconductor device, stencil mask and method for manufacturing the same
TOSHIBA KK24 citations93
US6964893B2Nov 15, 2005
Semiconductor device and method of fabricating the same
TOSHIBA KK20 citations93
US6887747B2May 3, 2005
Method of forming a MISFET having a schottky junctioned silicide
TOSHIBA KK39 citations93
US6833596B2Dec 21, 2004
Semiconductor device and method of manufacturing the same
TOSHIBA KK26 citations93
US6770402B2Aug 3, 2004
Method for manufacturing a semiconductor device, stencil mask and method for manufacturing the same
TOSHIBA KK24 citations93
US6737309B2May 18, 2004
Complementary MISFET
TOSHIBA KK36 citations93
US7781848B2Aug 24, 2010
Semiconductor device with extension structure and method for fabricating the same
TOSHIBA KK8 citations84
US7745073B2Jun 29, 2010
Method for manufacturing a semiconductor device, stencil mask and method for manufacturing a the same
TOSHIBA KK10 citations84
US7642162B2Jan 5, 2010
Semiconductor device and method of manufacturing the same
TOSHIBA KK10 citations84
US7602013B2Oct 13, 2009
Semiconductor device with recessed channel
TOSHIBA KK12 citations84
US7459246B2Dec 2, 2008
Method for manufacturing a semiconductor device, stencil mask and method for manufacturing a the same
TOSHIBA KK9 citations84
US6992357B2Jan 31, 2006
Semiconductor device and method of manufacturing the same
TOSHIBA KK14 citations84
US6967379B2Nov 22, 2005
Semiconductor device including metal insulator semiconductor field effect transistor
TOSHIBA KK15 citations84
US7902603B2Mar 8, 2011
Semiconductor device and method of manufacturing the same
TOSHIBA KK5 citations74
US7208797B2Apr 24, 2007
Semiconductor device
TOSHIBA KK8 citations74
US7179702B2Feb 20, 2007
Semiconductor device including metal insulator semiconductor field effect transistor and method of manufacturing the same
TOSHIBA KK7 citations74
US9153779B2Oct 6, 2015
Resistance change memory element and resistance change memory
TOSHIBA KK6 citations72
US7981795B2Jul 19, 2011
Semiconductor device manufacturing method
TOSHIBA KK4 citations63
US7767535B2Aug 3, 2010
Semiconductor device and method of manufacturing the same
TOSHIBA KK5 citations63
US7172955B2Feb 6, 2007
Silicon composition in CMOS gates
TOSHIBA KK3 citations63
NGK SPARK PLUG CO
10 patentsUS7340942B2Mar 11, 2008
Sensor including a sensor element having electrode terminals spaced apart from a connecting end thereof
NGK SPARK PLUG CO33 citations93
US6548023B1Apr 15, 2003
Gas sensor
NGK SPARK PLUG CO20 citations90
US7461538B2Dec 9, 2008
Sensor and method of producing sensor
NGK SPARK PLUG CO15 citations84
US6395159B2May 28, 2002
Oxygen sensor
NGK SPARK PLUG CO17 citations82
US7341650B2Mar 11, 2008
Method of manufacturing sensor and sensor
NGK SPARK PLUG CO8 citations74
US6510728B2Jan 28, 2003
Gas sensor including inorganic powder filling gap between measuring element and metallic shell
NGK SPARK PLUG CO12 citations74
US6500322B2Dec 31, 2002
Gas sensor
NGK SPARK PLUG CO13 citations74
US7430894B2Oct 7, 2008
Gas sensor
NGK SPARK PLUG CO8 citations66
US7935235B2May 3, 2011
Gas sensor with sealing structure
NGK SPARK PLUG CO2 citations63
US7674143B2Mar 9, 2010
Sensor and method of producing sensor
NGK SPARK PLUG CO6 citations63
TOSHIBA MEMORY CORP
5 patentsUS10211166B2Feb 19, 2019
Semiconductor device and method of manufacturing the same
TOSHIBA MEMORY CORP29 citations94
US10319730B2Jun 11, 2019
Memory device having a plurality of first conductive pillars penetrating through a stacked film
TOSHIBA MEMORY CORP8 citations84
US9793293B1Oct 17, 2017
Semiconductor device and method for manufacturing same
TOSHIBA MEMORY CORP13 citations83
US11217745B2Jan 4, 2022
Magnetoresistive memory device and method for manufacturing magnetoresistive memory device
TOSHIBA MEMORY CORP2 citations73
US10629810B2Apr 21, 2020
Resistance-change type memory device
TOSHIBA MEMORY CORP3 citations71
MATSUO KOUJI
3 patentsTOKYO SHIBAURA ELECTRIC CO
2 patentsMATSUBARA YOSHIAKI
1 patentMITSUBOSHI BELTING LTD
1 patentKIOXIA CORP
1 patentShowing the top 50 of 70 patents by PatentIndex Score.