Inventor
BRUNNER MATTHIAS
DE44 patents
⚠️ This page may combine multiple inventors who share the name “BRUNNER MATTHIAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
16 patentsUS6730906B2May 4, 2004
Method and apparatus for testing a substrate
APPLIED MATERIALS INC29 citations92
US7129694B2Oct 31, 2006
Large substrate test system
APPLIED MATERIALS INC21 citations91
US7319335B2Jan 15, 2008
Configurable prober for TFT LCD array testing
APPLIED MATERIALS INC38 citations90
US6465795B1Oct 15, 2002
Charge neutralization of electron beam systems
APPLIED MATERIALS INC40 citations90
US7355418B2Apr 8, 2008
Configurable prober for TFT LCD array test
APPLIED MATERIALS INC14 citations83
US7746088B2Jun 29, 2010
In-line electron beam test system
APPLIED MATERIALS INC6 citations73
US7535238B2May 19, 2009
In-line electron beam test system
APPLIED MATERIALS INC5 citations73
US7372250B2May 13, 2008
Methods and apparatus for determining a position of a substrate relative to a support stage
APPLIED MATERIALS INC7 citations72
US7075323B2Jul 11, 2006
Large substrate test system
APPLIED MATERIALS INC7 citations72
US7973546B2Jul 5, 2011
In-line electron beam test system
APPLIED MATERIALS INC1 citations62
US7786742B2Aug 31, 2010
Prober for electronic device testing on large area substrates
APPLIED MATERIALS INC2 citations59
US7317325B2Jan 8, 2008
Line short localization in LCD pixel arrays
APPLIED MATERIALS INC5 citations54
US7375505B2May 20, 2008
Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method
APPLIED MATERIALS INC0 citations52
US7602199B2Oct 13, 2009
Mini-prober for TFT-LCD testing
APPLIED MATERIALS INC1 citations51
US7847566B2Dec 7, 2010
Configurable prober for TFT LCD array test
APPLIED MATERIALS INC0 citations50
US7256606B2Aug 14, 2007
Method for testing pixels for LCD TFT displays
APPLIED MATERIALS INC0 citations48
SIEMENS AG
12 patentsUS4985681AJan 15, 1991
Particle beam measuring method for non-contact testing of interconnect networks
SIEMENS AG55 citations96
US5414374AMay 9, 1995
Method for particle beam testing of substrates for liquid crystal displays (LCD)
SIEMENS AG37 citations92
US5371459ADec 6, 1994
Method for particle beam testing of substrates for liquid crystal displays using parasitic currents
SIEMENS AG36 citations92
US5268638ADec 7, 1993
Method for particle beam testing of substrates for liquid crystal displays "LCD"
SIEMENS AG38 citations92
US5258706ANov 2, 1993
Method for the recognition of testing errors in the test of microwirings
SIEMENS AG33 citations92
US4954705ASep 4, 1990
Method for examining a specimen in a particle beam instrument
SIEMENS AG35 citations92
US4983833AJan 8, 1991
Device for the detecting of charged secondary particles
SIEMENS AG38 citations89
US4831267AMay 16, 1989
Detector for charged particles
SIEMENS AG20 citations82
US4841242AJun 20, 1989
Method for testing conductor networks
SIEMENS AG8 citations74
US4748407AMay 31, 1988
Method and apparatus for measuring time dependent signals with a particle probe
SIEMENS AG9 citations74
US5373233ADec 13, 1994
Method for the recognition of testing errors in the test of microwirings
SIEMENS AG5 citations63
US5045783ASep 3, 1991
Method for testing a printed circuit board with a particle probe
SIEMENS AG5 citations61
BRUNNER MATTHIAS
4 patentsUS8115506B2Feb 14, 2012
Localization of driver failures within liquid crystal displays
BRUNNER MATTHIAS8 citations82
US8208114B2Jun 26, 2012
Drive apparatus with improved testing properties
BRUNNER MATTHIAS2 citations61
US9366696B2Jun 14, 2016
Roll to roll tester and method of testing flexible substrates roll to roll
BRUNNER MATTHIAS0 citations51
US10329588B2Jun 25, 2019
Device for the biomethanation of H2 and CO2
BRUNNER MATTHIAS0 citations40
APPLIED MATERIALS GMBH
3 patentsUS7135875B2Nov 14, 2006
Apparatus and method for contacting of test objects
APPLIED MATERIALS GMBH3 citations60
US7474108B2Jan 6, 2009
Apparatus and method for contacting of test objects
APPLIED MATERIALS GMBH0 citations50
US8009299B2Aug 30, 2011
Method for beam calibration and usage of a calibration body
APPLIED MATERIALS GMBH0 citations36