Inventor
AGASHE ANUPAMA ANIRUDDHA
IN3 patents
Patents
3 patentsUS7134061B2Nov 7, 2006
At-speed ATPG testing and apparatus for SoC designs having multiple clock domain using a VLCT test platform
TEXAS INSTRUMENTS INC69 citations95
US6925408B2Aug 2, 2005
Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components
TEXAS INSTRUMENTS INC19 citations79
US7120842B2Oct 10, 2006
Mechanism to enhance observability of integrated circuit failures during burn-in tests
TEXAS INSTRUMENTS INC2 citations54