Inventor

DUFFY BRIAN

US41 patents

⚠️ This page may combine multiple inventors who share the name “DUFFY BRIAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DUFFY BRIAN

KLA TENCOR CORP

Generalized virtual inspector

Systems and methods for creating inspection recipes

Virtual inspection systems with multiple modes

Accelerated training of a machine learning based model for semiconductor applications

Virtual inspection systems with multiple modes

Particle beam inspector with independently-controllable beams

Hybrid inspectors

And noise based care areas

Inspection recipe setup from reference image variation

Detecting defects on a wafer with run time use of design data

Methods and systems for detecting defects on a reticle

Determining coordinates for an area of interest on a specimen

Active learning for defect classifier training

Identifying nuisances and defects of interest in defects detected on a wafer

Hybrid inspection system for efficient process window discovery

Voltage contrast based fault and defect inference in logic chips

Metrology recipe generation using predicted metrology images

Determining one or more characteristics of a pattern of interest on a specimen

Automated pattern fidelity measurement plan generation

Virtual inspection systems for process window characterization

Automated pattern fidelity measurement plan generation

Generating high resolution images from low resolution images for semiconductor applications

KLA CORP

Multi-controller inspection system

Mode selection and defect detection training

Context-based defect inspection

Deep learning based mode selection for inspection

KLA TENCOR TECH CORP

Methods and systems for utilizing design data in combination with inspection data

Methods and systems for determining a position of inspection data in design data space

KULKARNI ASHOK

Methods and systems for utilizing design data in combination with inspection data

Semiconductor device property extraction, generation, visualization, and monitoring methods

JOHNSON & JOHNSON PROFESSIONAL

Locking orthopaedic clamping tool

BHASKAR KRIS

Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions

PARK ALLEN

Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions

LEE CHRIS

Selecting one or more parameters for inspection of a wafer

BMIC LLC

Hybrid layered structure, method and system including same

CARRIER CORP

Extraction of policies from static permissions and access events for physical access control

HUET PATRICK

Monitoring of time-varying defect classification performance

HPL TECHNOLOGIES INC

Correction of overlay offset between inspection layers

CHICH ADEM

Impeller exhaust ridge vent

BUILDING MATERIALS INVEST CORP

Self adhesive universal inside corner patch for membrane roofing

PREMIER ELECTION SOLUTIONS INC

Hinged paper voting ballot