Inventor
IWASAKI KOUJI
JP21 patents
⚠️ This page may combine multiple inventors who share the name “IWASAKI KOUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SII NANOTECHNOLOGY INC
13 patentsUS7442942B2Oct 28, 2008
Charged particle beam apparatus
SII NANOTECHNOLOGY INC20 citations92
US6838685B1Jan 4, 2005
Ion beam apparatus, ion beam processing method and sample holder member
SII NANOTECHNOLOGY INC26 citations91
US7973280B2Jul 5, 2011
Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same
SII NANOTECHNOLOGY INC7 citations84
US7267731B2Sep 11, 2007
Method and system for fabricating three-dimensional microstructure
SII NANOTECHNOLOGY INC11 citations83
US7626165B2Dec 1, 2009
Focused ion beam apparatus and method of preparing/observing sample
SII NANOTECHNOLOGY INC7 citations73
US7067823B2Jun 27, 2006
Micro-sample pick-up apparatus and micro-sample pick-up method
SII NANOTECHNOLOGY INC10 citations73
US7297944B2Nov 20, 2007
Ion beam device and ion beam processing method, and holder member
SII NANOTECHNOLOGY INC9 citations70
US7404339B2Jul 29, 2008
Probe and small sample pick up mechanism
SII NANOTECHNOLOGY INC3 citations62
US7002150B2Feb 21, 2006
Thin specimen producing method and apparatus
SII NANOTECHNOLOGY INC6 citations62
US7276691B2Oct 2, 2007
Ion beam device and ion beam processing method
SII NANOTECHNOLOGY INC6 citations61
US7345289B2Mar 18, 2008
Sample support prepared by semiconductor silicon process technique
SII NANOTECHNOLOGY INC4 citations54
US7736893B2Jun 15, 2010
Nanobio device of imitative anatomy structure
SII NANOTECHNOLOGY INC0 citations51
US7060397B2Jun 13, 2006
EPL mask processing method and device thereof
SII NANOTECHNOLOGY INC0 citations51