Inventor
ARAMAKI FUMIO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “ARAMAKI FUMIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH SCIENCE CORP
7 patentsUS8764994B2Jul 1, 2014
Method for fabricating emitter
HITACHI HIGH TECH SCIENCE CORP4 citations72
US9378858B2Jun 28, 2016
Repair apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US8890093B2Nov 18, 2014
Charged particle beam apparatus and method for forming observation image
HITACHI HIGH TECH SCIENCE CORP2 citations62
US9336979B2May 10, 2016
Focused ion beam apparatus with precious metal emitter surface
HITACHI HIGH TECH SCIENCE CORP1 citations51
US8999178B2Apr 7, 2015
Method for fabricating emitter
HITACHI HIGH TECH SCIENCE CORP0 citations51
US10276343B2Apr 30, 2019
Method for acquiring image and ion beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations50
US10014157B2Jul 3, 2018
Method for acquiring image and ion beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations50
HITACHI HIGH-TECH SCIENCE CORP
5 patentsUS9773634B2Sep 26, 2017
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
HITACHI HIGH-TECH SCIENCE CORP2 citations72
US9418817B2Aug 16, 2016
Focused ion beam apparatus and control method thereof
HITACHI HIGH-TECH SCIENCE CORP2 citations62
US9793085B2Oct 17, 2017
Focused ion beam apparatus
HITACHI HIGH-TECH SCIENCE CORP0 citations51
US9583299B2Feb 28, 2017
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
HITACHI HIGH-TECH SCIENCE CORP0 citations51
US9793092B2Oct 17, 2017
Charged particle beam apparatus and processing method
HITACHI HIGH-TECH SCIENCE CORP0 citations38