Inventor
OOSAKI AKIO
JP3 patents
Patents
3 patentsUS6275023B1Aug 14, 2001
Semiconductor device tester and method for testing semiconductor device
HITACHI ELECTR ENG74 citations93
US6448800B1Sep 10, 2002
Load current output circuit for electronic device and IC tester using the same load current output circuit
HITACHI ELECTR ENG11 citations72
US6424201B2Jul 23, 2002
Diode element circuit and switch circuit using the same
HITACHI ELECTR ENG4 citations61