P

Inventor

HUNG CHIEN-YAO

TW8 patents
⚠️ This page may combine multiple inventors who share the name “HUNG CHIEN-YAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HERMES-EPITEK CORP

3 patents
US9423423B2Aug 23, 2016

Probe card for testing wafers

HERMES-EPITEK CORP5 citations69
US9521750B2Dec 13, 2016

Printed circuit board of probe card

HERMES-EPITEK CORP0 citations37
US9408293B2Aug 2, 2016

Printed circuit board structure

HERMES-EPITEK CORP0 citations37

HERMES EPITEK CORP

3 patents
US10247756B2Apr 2, 2019

Probe card structure

HERMES EPITEK CORP1 citations58
US9970961B2May 15, 2018

Probe card for testing wafers with fine pitch circuit

HERMES EPITEK CORP0 citations48
US9279853B2Mar 8, 2016

Test probe card structure

HERMES EPITEK CORP1 citations48

HERMES TESTING SOLUTIONS INC

1 patent
US8358146B2Jan 22, 2013

CMOS image sensor test probe card

HERMES TESTING SOLUTIONS INC1 citations47

HUNG CHIEN-YAO

1 patent
US8829936B2Sep 9, 2014

Probe card structure adaptable to different test apparatuses of different specifications

HUNG CHIEN-YAO1 citations42