Inventor

LAI LILUNG

CN3 patents

⚠️ This page may combine multiple inventors who share the name “LAI LILUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SEMICONDUCTOR MFG INT BEIJING CORP

2 patents

US9557348B2Jan 31, 2017

Semiconductor testing structures and fabrication method thereof

SEMICONDUCTOR MFG INT BEIJING CORP2 citations70

US9606173B2Mar 28, 2017

In-chip static-current device failure detecting methods and apparatus

SEMICONDUCTOR MFG INT BEIJING CORP0 citations46

SEMICONDUCTOR MFG INTERNATIONAL (BEIJING) CORPORATION

1 patent

US9823271B2Nov 21, 2017

Semiconductor testing structures and semiconductor testing apparatus

SEMICONDUCTOR MFG INTERNATIONAL (BEIJING) CORPORATION0 citations48