Inventor
SHABTAY SAAR
IL9 patents
Patents
9 patentsUS9286675B1Mar 15, 2016
Iterative defect filtering process
APPLIED MATERIALS ISRAEL LTD23 citations91
US10871451B2Dec 22, 2020
System, method and computer program product for object examination
APPLIED MATERIALS ISRAEL LTD2 citations71
US11592400B2Feb 28, 2023
System, method and computer program product for object examination
APPLIED MATERIALS ISRAEL LTD0 citations60
US10408764B2Sep 10, 2019
System, method and computer program product for object examination
APPLIED MATERIALS ISRAEL LTD1 citations60
US11940390B2Mar 26, 2024
Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest
APPLIED MATERIALS ISRAEL LTD0 citations56
US11360030B2Jun 14, 2022
Selecting a coreset of potential defects for estimating expected defects of interest
APPLIED MATERIALS ISRAEL LTD0 citations56
US10049441B2Aug 14, 2018
Iterative defect filtering process
APPLIED MATERIALS ISRAEL LTD0 citations50
US10818000B2Oct 27, 2020
Iterative defect filtering process
APPLIED MATERIALS ISRAEL LTD0 citations45
US10605745B2Mar 31, 2020
Guided inspection of a semiconductor wafer based on systematic defects
APPLIED MATERIALS ISRAEL LTD0 citations45