P

Inventor

MILLER JAMES E

US80 patents
⚠️ This page may combine multiple inventors who share the name “MILLER JAMES E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

21 patents
US6388480B1May 14, 2002

Method and apparatus for reducing the lock time of DLL

MICRON TECHNOLOGY INC87 citations98
US5677567AOct 14, 1997

Leads between chips assembly

MICRON TECHNOLOGY INC93 citations97
US6791381B2Sep 14, 2004

Method and apparatus for reducing the lock time of a DLL

MICRON TECHNOLOGY INC49 citations96
US6028799AFeb 22, 2000

Memory circuit voltage regulator

MICRON TECHNOLOGY INC17 citations96
US5894165AApr 13, 1999

Leads between chips assembly

MICRON TECHNOLOGY INC45 citations96
US5770480AJun 23, 1998

Method of leads between chips assembly

MICRON TECHNOLOGY INC35 citations96
US6664830B2Dec 16, 2003

Low pass filters in DLL circuits

MICRON TECHNOLOGY INC29 citations93
US6232148B1May 15, 2001

Method and apparatus leads-between-chips

MICRON TECHNOLOGY INC31 citations90
US5877993AMar 2, 1999

Memory circuit voltage regulator

MICRON TECHNOLOGY INC16 citations86
US6917230B2Jul 12, 2005

Low pass filters in DLL circuits

MICRON TECHNOLOGY INC13 citations84
US6778452B2Aug 17, 2004

Circuit and method for voltage regulation in a semiconductor device

MICRON TECHNOLOGY INC6 citations82
US6052322AApr 18, 2000

Memory circuit voltage regulator

MICRON TECHNOLOGY INC6 citations82
US6011731AJan 4, 2000

Cell plate regulator

MICRON TECHNOLOGY INC7 citations82
US6898144B2May 24, 2005

Actively driven VREF for input buffer noise immunity

MICRON TECHNOLOGY INC4 citations74
US6441668B1Aug 27, 2002

Digital device with internal differential signal generator

MICRON TECHNOLOGY INC7 citations74
US6181617B1Jan 30, 2001

Method and apparatus for testing a semiconductor device

MICRON TECHNOLOGY INC2 citations74
US5982687ANov 9, 1999

Method of detecting leakage within a memory cell capacitor

MICRON TECHNOLOGY INC3 citations74
US6882587B2Apr 19, 2005

Method of preparing to test a capacitor

MICRON TECHNOLOGY INC0 citations63
US6600687B2Jul 29, 2003

Method of compensating for a defect within a semiconductor device

MICRON TECHNOLOGY INC0 citations63
US6597619B2Jul 22, 2003

Actively driven VREF for input buffer noise immunity

MICRON TECHNOLOGY INC4 citations63
US6469944B2Oct 22, 2002

Method of compensating for a defect within a semiconductor device

MICRON TECHNOLOGY INC0 citations63

MILLER JAMES E

6 patents

NAT TECH & ENG SOLUTIONS SANDIA LLC

5 patents

US ARMY

3 patents

SANDIA CORP

3 patents

US NAVY

2 patents

AIR AND LIQUID SYSTEMS INC

2 patents

UNION CARBIDE IND GASES TECH

1 patent

(unassigned)

1 patent

US WEST INC

1 patent

UNION CARBIDE CORP

1 patent

URQUHART GORDON T

1 patent

WAUSAU TILE INC

1 patent

FORM INCORPORATED

1 patent

SOLAR FIBER OPTICS LLC

1 patent

Showing the top 50 of 80 patents by PatentIndex Score.