Inventor
ESSERS ERIK
DE16 patents
⚠️ This page may combine multiple inventors who share the name “ESSERS ERIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ZEISS CARL MICROSCOPY GMBH
8 patentsUS10068744B2Sep 4, 2018
Charged particle optical apparatus for through-the lens detection of particles
ZEISS CARL MICROSCOPY GMBH5 citations82
US11276547B2Mar 15, 2022
Charged particle optical apparatus for through-the-lens detection of particles
ZEISS CARL MICROSCOPY GMBH2 citations71
US10522321B2Dec 31, 2019
Charged particle optical apparatus for through-the-lens detection of particles
ZEISS CARL MICROSCOPY GMBH3 citations71
US9741528B2Aug 22, 2017
Charged particle optical apparatus having a selectively positionable differential pressure module
ZEISS CARL MICROSCOPY GMBH6 citations71
US10984977B2Apr 20, 2021
Particle beam system and method for operating a particle beam system
ZEISS CARL MICROSCOPY GMBH0 citations51
US10861670B2Dec 8, 2020
Charged particle optical apparatus for through-the-lens detection of particles
ZEISS CARL MICROSCOPY GMBH0 citations50
US12362129B2Jul 15, 2025
Particle beam column
ZEISS CARL MICROSCOPY GMBH0 citations48
US12300461B2May 13, 2025
Particle beam device, method for operating the particle beam device and computer program product
ZEISS CARL MICROSCOPY GMBH0 citations48
CARL ZEISS MULTISEM GMBH
3 patentsUS10854423B2Dec 1, 2020
Multi-beam particle beam system
CARL ZEISS MULTISEM GMBH31 citations92
US11239054B2Feb 1, 2022
Multi-beam particle beam system
CARL ZEISS MULTISEM GMBH0 citations60
US12340973B2Jun 24, 2025
Particle beam system including a multi-beam deflection device and a beam stop, method for operating the particle beam system and associated computer program product
CARL ZEISS MULTISEM GMBH0 citations49