Inventor
TSAI CHIH-CHIEH
TW27 patents
Patents
27 patentsUS10043811B1Aug 7, 2018
Semiconductor structure for preventing row hammering issue in DRAM cell and method for manufacturing the same
UNITED MICROELECTRONICS CORP14 citations92
US9953982B1Apr 24, 2018
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP7 citations83
US9754943B1Sep 5, 2017
Dynamic random access memory device
UNITED MICROELECTRONICS CORP8 citations83
US10475799B2Nov 12, 2019
Method of fabricating bit line
UNITED MICROELECTRONICS CORP2 citations73
US10290638B1May 14, 2019
Method of forming dynamic random access memory device
UNITED MICROELECTRONICS CORP5 citations73
US9773789B1Sep 26, 2017
Dynamic random access memory device
UNITED MICROELECTRONICS CORP3 citations73
US10312242B2Jun 4, 2019
Semiconductor memory device
UNITED MICROELECTRONICS CORP2 citations72
US10211211B1Feb 19, 2019
Method for fabricating buried word line of a dynamic random access memory
UNITED MICROELECTRONICS CORP2 citations72
US9859123B1Jan 2, 2018
Method for fabricating semiconductor device
UNITED MICROELECTRONICS CORP2 citations72
US12325054B2Jun 10, 2025
Monitor wafer and method of using the same
UNITED MICROELECTRONICS CORP0 citations62
US12075613B2Aug 27, 2024
Buried word line of a dynamic random access memory and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11799012B2Oct 24, 2023
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11251187B2Feb 15, 2022
Buried word line of a dynamic random access memory and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11239243B2Feb 1, 2022
Semiconductor structure for preventing row hammering issue in DRAM cell and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations62
US11239241B2Feb 1, 2022
Bit line utilized in DRAM
UNITED MICROELECTRONICS CORP1 citations62
US11088023B2Aug 10, 2021
Method of forming a semiconductor structure
UNITED MICROELECTRONICS CORP0 citations62
US10475900B2Nov 12, 2019
Method for manufacturing a semiconductor device with a cobalt silicide film
UNITED MICROELECTRONICS CORP1 citations62
US10374051B1Aug 6, 2019
Method for fabricating semiconductor device
UNITED MICROELECTRONICS CORP1 citations62
US11877433B2Jan 16, 2024
Storage node contact structure of a memory device
UNITED MICROELECTRONICS CORP0 citations61
US11222784B2Jan 11, 2022
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations60
US10685964B2Jun 16, 2020
Semiconductor structure for preventing row hammering issue in DRAM cell and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations52
US10497705B2Dec 3, 2019
Bit line gate and manufacturing method thereof
UNITED MICROELECTRONICS CORP0 citations52
US10804365B2Oct 13, 2020
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations51
US10756090B2Aug 25, 2020
Storage node contact structure of a memory device and manufacturing methods thereof
UNITED MICROELECTRONICS CORP0 citations51
US10707214B2Jul 7, 2020
Fabricating method of cobalt silicide layer coupled to contact plug
UNITED MICROELECTRONICS CORP0 citations51
US10276389B1Apr 30, 2019
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations51
US10651040B2May 12, 2020
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations50