Inventor

MURAYAMA SAKON

JP3 patents

Patents

3 patents

US10605701B2Mar 31, 2020

Analysis system

JTEKT CORP1 citations56

US10354522B2Jul 16, 2019

Optical detection device and facility management system

JTEKT CORP1 citations56

US10474128B2Nov 12, 2019

Abnormality analysis system and analysis apparatus

JTEKT CORP0 citations36