Inventor
LIN LONG-HUI
TW7 patents
Patents
7 patentsUS7071011B2Jul 4, 2006
Method of defect review
POWERCHIP SEMICONDUCTOR CORP9 citations71
US6825119B1Nov 30, 2004
Method of piping defect detection
POWERCHIP SEMICONDUCTOR CORP12 citations71
US7020536B2Mar 28, 2006
Method of building a defect database
POWERCHIP SEMICONDUCTOR CORP10 citations67
US7382451B2Jun 3, 2008
Method of defect inspection
POWERCHIP SEMICONDUCTOR CORP6 citations60
US6807454B2Oct 19, 2004
Method for automatically controlling defect -specification in a semiconductor manufacturing process
POWERCHIP SEMICONDUCTOR CORP6 citations60
US7132354B2Nov 7, 2006
Inspection methods for a semiconductor device
POWERCHIP SEMICONDUCTOR CORP2 citations55
US7193698B2Mar 20, 2007
Wafer defect detection methods and systems
POWERCHIP SEMICONDUCTOR CORP3 citations52