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Inventor
SCHULER BRUNO
CH
2 patents
Patents
2 patents
US9784762B2
Oct 10, 2017
Determination of local contact potential difference by noncontact atomic force microscopy
IBM
0 citations
47
US9316668B2
Apr 19, 2016
Determination of local contact potential difference by noncontact atomic force microscopy
IBM
1 citations
47