P

Inventor

FARNSWORTH III LEONARD O

US4 patents
⚠️ This page may combine multiple inventors who share the name “FARNSWORTH III LEONARD O”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

3 patents
US7305600B2Dec 4, 2007

Partial good integrated circuit and method of testing same

IBM11 citations80
US7478301B2Jan 13, 2009

Partial good integrated circuit and method of testing same

IBM2 citations59
US7434129B2Oct 7, 2008

Partial good integrated circuit and method of testing same

IBM3 citations57

CADENCE DESIGN SYSTEMS INC

1 patent
US7103816B2Sep 5, 2006

Method and system for reducing test data volume in the testing of logic products

CADENCE DESIGN SYSTEMS INC4 citations60