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Inventor
FELSKE MICHAEL Z
US
3 patents
Patents
3 patents
US7305600B2
Dec 4, 2007
Partial good integrated circuit and method of testing same
IBM
11 citations
80
US7478301B2
Jan 13, 2009
Partial good integrated circuit and method of testing same
IBM
2 citations
59
US7434129B2
Oct 7, 2008
Partial good integrated circuit and method of testing same
IBM
3 citations
57