Inventor

RUAN WEI WEI

CN3 patents

⚠️ This page may combine multiple inventors who share the name “RUAN WEI WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHI WEN

2 patents

US8323990B2Dec 4, 2012

Reliability test structure for multilevel interconnect

SHI WEN5 citations56

US8164091B2Apr 24, 2012

Multi-purpose poly edge test structure

SHI WEN1 citations46

SEMICONDUCTOR MFG INT SHANGHAI

1 patent

US7439538B2Oct 21, 2008

Multi-purpose poly edge test structure

SEMICONDUCTOR MFG INT SHANGHAI6 citations70