P

Inventor

CARLSSON INGEMAR

US29 patents
⚠️ This page may combine multiple inventors who share the name “CARLSSON INGEMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

21 patents
US7097537B1Aug 29, 2006

Determination of position of sensor measurements during polishing

APPLIED MATERIALS INC81 citations98
US9281253B2Mar 8, 2016

Determination of gain for eddy current sensor

APPLIED MATERIALS INC28 citations94
US7444198B2Oct 28, 2008

Determining physical property of substrate

APPLIED MATERIALS INC17 citations92
US9636797B2May 2, 2017

Adjusting eddy current measurements

APPLIED MATERIALS INC11 citations84
US9205527B2Dec 8, 2015

In-situ monitoring system with monitoring of elongated region

APPLIED MATERIALS INC7 citations84
US7952708B2May 31, 2011

High throughput measurement system

APPLIED MATERIALS INC13 citations84
US7840375B2Nov 23, 2010

Methods and apparatus for generating a library of spectra

APPLIED MATERIALS INC12 citations84
US9754846B2Sep 5, 2017

Inductive monitoring of conductive trench depth

APPLIED MATERIALS INC5 citations83
US12320883B2Jun 3, 2025

Resistivity-based adjustment of thresholds for in-situ monitoring

APPLIED MATERIALS INC1 citations74
US7746485B2Jun 29, 2010

Determining physical property of substrate

APPLIED MATERIALS INC6 citations74
US11199605B2Dec 14, 2021

Resistivity-based adjustment of measurements from in-situ monitoring

APPLIED MATERIALS INC1 citations73
US11079459B2Aug 3, 2021

Resistivity-based calibration of in-situ electromagnetic inductive monitoring

APPLIED MATERIALS INC1 citations73
US10556315B2Feb 11, 2020

Determination of gain for eddy current sensor

APPLIED MATERIALS INC1 citations73
US10103073B2Oct 16, 2018

Inductive monitoring of conductive trench depth

APPLIED MATERIALS INC3 citations72
US9472475B2Oct 18, 2016

Feedback control using detection of clearance and adjustment for uniform topography

APPLIED MATERIALS INC2 citations63
US8014004B2Sep 6, 2011

Determining physical property of substrate

APPLIED MATERIALS INC4 citations63
US10207386B2Feb 19, 2019

Determination of gain for eddy current sensor

APPLIED MATERIALS INC1 citations62
US10589397B2Mar 17, 2020

Endpoint control of multiple substrate zones of varying thickness in chemical mechanical polishing

APPLIED MATERIALS INC1 citations61
US10427272B2Oct 1, 2019

Endpoint detection with compensation for filtering

APPLIED MATERIALS INC0 citations52
US10741459B2Aug 11, 2020

Inductive monitoring of conductive loops

APPLIED MATERIALS INC0 citations51
US9275917B2Mar 1, 2016

Determination of gain for eddy current sensor

APPLIED MATERIALS INC0 citations41

IRAVANI HASSAN G

2 patents

ZHANG JIMIN

2 patents

LIHNELL VAGN AB

1 patent

UPONOR NV

1 patent

XU KUN

1 patent

DUBOUST ALAIN

1 patent