Inventor

LEE YUEN TAT

MY3 patents

⚠️ This page may combine multiple inventors who share the name “LEE YUEN TAT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

2 patents

US9971644B2May 15, 2018

Serial I/O functional tester

INTEL CORP0 citations48

US7403027B2Jul 22, 2008

Apparatuses and methods for outputting signals during self-heat burn-in modes of operation

INTEL CORP1 citations40

TROBOUGH MARK B

1 patent

US10198333B2Feb 5, 2019

Test, validation, and debug architecture

TROBOUGH MARK B6 citations64