Inventor
SUNDAR VIGNESH
US43 patents
⚠️ This page may combine multiple inventors who share the name “SUNDAR VIGNESH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
33 patentsUS10522746B1Dec 31, 2019
Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD16 citations94
US11417835B2Aug 16, 2022
Nitride capping layer for spin torque transfer (STT) magnetoresistive random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10868237B2Dec 15, 2020
Self-aligned encapsulation hard mask to separate physically under-etched MTJ cells to reduce conductive R-deposition
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10797225B2Oct 6, 2020
Dual magnetic tunnel junction (DMTJ) stack design
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10665773B2May 26, 2020
Nitride capping layer for spin torque transfer (STT)-magnetoresistive random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10516100B2Dec 24, 2019
Silicon oxynitride based encapsulation layer for magnetic tunnel junctions
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations84
US10297746B2May 21, 2019
Post treatment to reduce shunting devices for physical etching process
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US11430945B2Aug 30, 2022
MTJ device performance by adding stress modulation layer to MTJ device structure
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US11818961B2Nov 14, 2023
Self-aligned encapsulation hard mask to separate physically under-etched MTJ cells to reduce conductive re-deposition
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11696511B2Jul 4, 2023
Low resistance MgO capping layer for perpendicularly magnetized magnetic tunnel junctions
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11444241B2Sep 13, 2022
Self-aligned encapsulation hard mask to separate physically under-etched MTJ cells to reduce conductive R-deposition
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10797232B2Oct 6, 2020
Low resistance MgO capping layer for perpendicularly magnetized magnetic tunnel junctions
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10622047B2Apr 14, 2020
Free layer structure in magnetic random access memory (MRAM) for Mo or W perpendicular magnetic anisotropy (PMA) enhancing layer
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10522745B2Dec 31, 2019
Low resistance MgO capping layer for perpendicularly magnetized magnetic tunnel junctions
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10522749B2Dec 31, 2019
Combined physical and chemical etch to reduce magnetic tunnel junction (MTJ) sidewall damage
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US10475987B1Nov 12, 2019
Method for fabricating a magnetic tunneling junction (MTJ) structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12027191B2Jul 2, 2024
Free layer structure in magnetic random access memory (MRAM) for Mo or W perpendicular magnetic anisotropy (PMA) enhancing layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11087810B2Aug 10, 2021
Free layer structure in magnetic random access memory (MRAM) for Mo or W perpendicular magnetic anisotropy (PMA) enhancing layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12501836B2Dec 16, 2025
Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12356865B2Jul 8, 2025
Multilayer structure for reducing film roughness in magnetic devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12245516B2Mar 4, 2025
Self-aligned encapsulation hard mask to separate physically under-etched MTJ cells to reduce conductive re-deposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12207566B2Jan 21, 2025
MTJ device performance by adding stress modulation layer to MTJ device structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12185641B2Dec 31, 2024
Silicon oxynitride based encapsulation layer for magnetic tunnel junctions
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12082509B2Sep 3, 2024
Dual magnetic tunnel junction (DMTJ) stack design
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11956971B2Apr 9, 2024
Cooling for PMA (perpendicular magnetic anisotropy) enhancement of STT-MRAM (spin-torque transfer-magnetic random access memory) devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11903324B2Feb 13, 2024
Post treatment to reduce shunting devices for physical etching process
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11849646B2Dec 19, 2023
Nitride capping layer for spin torque transfer (STT) magnetoresistive random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11785864B2Oct 10, 2023
MTJ device performance by adding stress modulation layer to mtj device structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11495738B2Nov 8, 2022
Dual magnetic tunnel junction devices for magnetic random access memory (MRAM)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11424405B2Aug 23, 2022
Post treatment to reduce shunting devices for physical etching process
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11411174B2Aug 9, 2022
Silicon oxynitride based encapsulation layer for magnetic tunnel junctions
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11316103B2Apr 26, 2022
Combined physical and chemical etch to reduce magnetic tunnel junction (MTJ) sidewall damage
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10700269B2Jun 30, 2020
Post treatment to reduce shunting devices for physical etching process
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
HEADWAY TECH INC
10 patentsUS9935261B1Apr 3, 2018
Dielectric encapsulation layer for magnetic tunnel junction (MTJ) devices using radio frequency (RF) sputtering
HEADWAY TECH INC14 citations84
US11043632B2Jun 22, 2021
Ion beam etching process design to minimize sidewall re-deposition
HEADWAY TECH INC2 citations73
US11031548B2Jun 8, 2021
Reduce intermixing on MTJ sidewall by oxidation
HEADWAY TECH INC2 citations73
US10784310B2Sep 22, 2020
Cooling for PMA (perpendicular magnetic anisotropy) enhancement of STT-MRAM (spin torque transfer-magnetic random access memory) devices
HEADWAY TECH INC2 citations73
US10115892B2Oct 30, 2018
Multilayer structure for reducing film roughness in magnetic devices
HEADWAY TECH INC2 citations73
US10950782B2Mar 16, 2021
Nitride diffusion barrier structure for spintronic applications
HEADWAY TECH INC4 citations72
US12550623B2Feb 10, 2026
Nitride diffusion barrier structure for spintronic applications
HEADWAY TECH INC0 citations62
US12310245B2May 20, 2025
Etching and encapsulation scheme for magnetic tunnel junction fabrication
HEADWAY TECH INC0 citations62
US11631802B2Apr 18, 2023
Etching and encapsulation scheme for magnetic tunnel junction fabrication
HEADWAY TECH INC0 citations62
US11289645B2Mar 29, 2022
Method to integrate MRAM devices to the interconnects of 30nm and beyond CMOS technologies
HEADWAY TECH INC1 citations62