Inventor

KOZUKA NORIYOSHI

JP3 patents

⚠️ This page may combine multiple inventors who share the name “KOZUKA NORIYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

2 patents

US6417682B1Jul 9, 2002

Semiconductor device testing apparatus and its calibration method

ADVANTEST CORP46 citations90

US8014969B2Sep 6, 2011

Test apparatus, test method and manufacturing method

ADVANTEST CORP0 citations36

KOZUKA NORIYOSHI

1 patent

US8516430B2Aug 20, 2013

Test apparatus and circuit apparatus

KOZUKA NORIYOSHI2 citations49