P

Inventor

VAN HORN MARK T

US19 patents
⚠️ This page may combine multiple inventors who share the name “VAN HORN MARK T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

18 patents
US6198392B1Mar 6, 2001

Communications system and method with A/D converter

MICRON TECHNOLOGY INC117 citations98
US6563299B1May 13, 2003

Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC48 citations96
US6545605B2Apr 8, 2003

Methods of determining a communications range of an interrogator of a wireless identification system and methods of verifying operation of a wireless identification system

MICRON TECHNOLOGY INC64 citations96
US6466130B2Oct 15, 2002

Wireless communication devices, wireless communication systems, communication methods, methods of forming radio frequency identification devices, methods of testing wireless communication operations, radio frequency identification devices, and methods of forming radio frequency identification devices

MICRON TECHNOLOGY INC38 citations96
US6452496B1Sep 17, 2002

Radio frequency identification devices and a method of determining a communication range

MICRON TECHNOLOGY INC34 citations96
US6326889B1Dec 4, 2001

Radio frequency identification device and methods of determining a communication range of an interrogator of a wireless identification system

MICRON TECHNOLOGY INC62 citations96
US6831561B2Dec 14, 2004

Communications system and method with A/D converter

MICRON TECHNOLOGY INC14 citations92
US6342843B1Jan 29, 2002

Communications system and method with D/A converter

MICRON TECHNOLOGY INC27 citations92
US6137422AOct 24, 2000

Communications system and method with D/A converter

MICRON TECHNOLOGY INC36 citations92
US7327263B2Feb 5, 2008

Communications system and method with A/D converter

MICRON TECHNOLOGY INC5 citations73
US7145323B2Dec 5, 2006

Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC4 citations73
US6822438B2Nov 23, 2004

Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer

MICRON TECHNOLOGY INC4 citations73
US7294790B2Nov 13, 2007

Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC2 citations62
US7239152B2Jul 3, 2007

Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC2 citations62
US7208959B2Apr 24, 2007

Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC2 citations62
US7212013B2May 1, 2007

Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC0 citations52
US7208935B2Apr 24, 2007

Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC0 citations52
US7199593B2Apr 3, 2007

Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

MICRON TECHNOLOGY INC0 citations52

ROUND ROCK RES LLC

1 patent