Inventor
HEDDEN RICHARD N
US12 patents
Patents
12 patentsUS6563299B1May 13, 2003
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC48 citations96
US9741421B1Aug 22, 2017
Refresh circuitry
MICRON TECHNOLOGY INC31 citations93
US7145323B2Dec 5, 2006
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC4 citations73
US6822438B2Nov 23, 2004
Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer
MICRON TECHNOLOGY INC4 citations73
US11276450B2Mar 15, 2022
Refresh circuitry
MICRON TECHNOLOGY INC1 citations72
US10304515B2May 28, 2019
Refresh circuitry
MICRON TECHNOLOGY INC2 citations72
US7294790B2Nov 13, 2007
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC2 citations62
US7239152B2Jul 3, 2007
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC2 citations62
US7208959B2Apr 24, 2007
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC2 citations62
US7212013B2May 1, 2007
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC0 citations52
US7208935B2Apr 24, 2007
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC0 citations52
US7199593B2Apr 3, 2007
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
MICRON TECHNOLOGY INC0 citations52